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2024 IEEE 25th Latin American Test Symposium (LATS) ,
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Simulation-Based Analysis and Modeling of Generated Single ..:
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2024 IEEE 25th Latin American Test Symposium (LATS) ,
2
Aging and Soft Error Resilience in Reconfigurable CNN Accel..:
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2024 IEEE 25th Latin American Test Symposium (LATS) ,
3
Silicon Lifecycle Management Based on On-Chip Cross-Layer S..:
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2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS) ,
4
A Holistic Approach for Characterization of SET Effects in ..:
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2024 IEEE 25th Latin American Test Symposium (LATS) ,
5
Space Radiation Flux Driven Fault Injection for Evaluating ..:
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2023 26th Euromicro Conference on Digital System Design (DSD) ,
6
Towards a Smart Multi-Sensor Ionizing Radiation Monitoring ..:
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2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
7
Towards a Comprehensive SET Analysis Flow for VLSI Circuits..:
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2023 38th Conference on Design of Circuits and Integrated Systems (DCIS) ,
8
SET and SEU Hardened Clock Gating Cell:
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2023 IEEE Nordic Circuits and Systems Conference (NorCAS) ,
9
Adaptive Lock-Step System for Resilient Multiprocessing Arc..:
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2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
10
A Machine Learning-driven EDAC Method for Space-Application..:
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2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
11
A Tunable Single Event Transient Filter Based on Digitally ..:
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2020 IEEE East-West Design & Test Symposium (EWDTS) ,
12
A Review of Particle Detectors for Space-Borne Self-Adaptiv..:
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2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS) ,
13
Characterization of Single Event Transient Effects in Stand..:
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2020 23rd Euromicro Conference on Digital System Design (DSD) ,
14
Design Concept for Radiation-Hardening of Triple Modular Re..:
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2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
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