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X
Barraud, J.L.
42  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Advanced silicon thin films for high-efficiency silicon het..:

, In: 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC),
Descoeudres, A. ; Allebe, C. ; Badel, N.... - p. 1-5 , 2017
Link: https://doi.org/10.1109/..
 
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2

On the conditioning of the generalised discrete-time Lyapun..:

, In: 2001 European Control Conference (ECC),
Gu, D. W. ; Lesecq, S. ; Christov, N. D.... - p. 2895-2897 , 2001
Link: https://doi.org/10.23919..
 
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3

Les sensibilisateurs calciques:

, In: L'insuffisance cardiaque aiguë,
Barraud, D. ; Farhat, I. ; Mebazaa, A. - p. 217-223 ,
Link: https://doi.org/10.1007/..
 
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4

Evaluation and implementation of High-Dimensionnal Computin..:

, In: 2024 International Conference on Control, Automation and Diagnosis (ICCAD),
Salerno, Ancelin ; Barraud, Sylvain - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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5

Fabrication of Low-Power RRAM for Stateful Hyperdimensional..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Dubreuil, T. ; Barraud, S. ; Previtali, B.... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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6

Disruptive approaches towards Energy Efficient VLSI Technol..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Faynot, Olivier ; Barraud, Sylvain ; Dubreuil, Theophile... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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7

Extraction of Drain Current Variability Components in Junct..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

5G SUCI Catcher: Attack and Detection:

, In: 2023 IEEE International Conference on Cloud Computing Technology and Science (CloudCom),
Barraud, Lorens ; Caccavale, Francesco ; Peyrat, Jean-Baptiste... - p. 285-290 , 2023
Link: https://doi.org/10.1109/..
 
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9

Ultra-High Sensitivity Silicon Nanowire Array Biosensor Bas..:

, In: ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC),
Sprunger, Y. ; Capua, L. ; Ernst, T.... - p. 153-156 , 2023
Link: https://doi.org/10.1109/..
 
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10

Drain Current Variability in 2-levels Stacked Nanowire Gate..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Kim, Donghyun ; Barraud, Sylvain ; Ghibaudo, Gerard.. - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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11

Integration of HfO2-based 3D OxRAM with GAA stacked-nanoshe..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Dubreuil, T. ; Barraud, S. ; Pedini, J.-M.... - p. 117-120 , 2023
Link: https://doi.org/10.1109/..
 
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12

Low-field Mobility Degradation Factors Temperature Dependen..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Rodrigues, Jaime Calcade ; Casse, Mikael ; Barraud, Sylvain... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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13

Electrical Characterization of Ω-Gate Nanowire MOSFETs Down..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
Matos, Jefferson Almeida ; de Souza, Michelly ; Casse, Mikael... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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14

Analysis of the Gate-Induced Drain Leakage of SOI Nanowire ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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15

Extraction of the Back Channel Mobility in SOI Nanowire MOS..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Bergamaschi, Flavio E. ; Wirth, Gilson I. ; Barraud, Sylvain... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
1-15