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Beleniotis, Petros
5  Ergebnisse:
Buchkapitel (Online) X
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1

Determining GaN HEMT Trap Models from MHz Load-Line Measure..:

, In: 2024 15th German Microwave Conference (GeMiC),
Rudolph, Matthias ; Beleniotis, Petros ; Zervos, Christos.. - p. 29-32 , 2024
Link: https://doi.org/10.23919..
 
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2

The role of gate leakage on surface-related current collaps..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
Zervos, Christos ; Beleniotis, Petros ; Krause, Sascha.. - p. 297-300 , 2023
Link: https://doi.org/10.23919..
 
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3

Dynamic RD Modeling by Exploiting Gate Current Dependency o..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
Beleniotis, Petros ; Zervos, Christos ; Schnieder, Frank. - p. 1-4 , 2023
Link: https://doi.org/10.23919..
 
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4

Localization of Trapping Effects in GaN HEMTs with Pulsed S..:

, In: 2022 17th European Microwave Integrated Circuits Conference (EuMIC),
Beleniotis, Petros ; Schnieder, Frank ; Chevtchenko, Serguei. - p. 149-152 , 2022
Link: https://doi.org/10.23919..
 
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5

On the Influence of Transistor Dimensions on the Dispersive..:

, In: 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022,
Krause, Sascha ; Zervos, Christos ; Beleniotis, Petros... - p. 914-917 , 2022
Link: https://doi.org/10.1109/..
 
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