Borga, A
34  Ergebnisse:
Personensuche X
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1

Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Millesimo, M. ; Fiegna, C. ; Bakeroot, B.... - p. 1-6 , 2024
 
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2

Ultra-Fast Positive Gate Bias Stress (<100ns) to Understand..:

, In: 2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Huang, Zhen-Hong ; Lin, Wei-Syuan ; Lo, Ting-Chun... - p. 139-142 , 2023
 
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3

GaN HEMT with p-Type Schottky Gate: A Case Study of TCAD Mo..:

, In: Lecture Notes in Electrical Engineering; Proceedings of SIE 2023,
 
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4

High- Temperature PBTI in Trench-Gate Vertical GaN Power MO..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Favero, D. ; Cavaliere, A. ; De Santi, C.... - p. 1-6 , 2023
 
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5

Developing support service to ENTSO-E: including the impact..:

, In: 22nd Wind and Solar Integration Workshop (WIW 2023),
Koivisto, M. ; Kanellas, P. ; Troccoli, A.... - p. None , 2023
 
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6

Contributors:

, In: Rainfall,
Ali, Haider ; Alnahit, Ali ; Borga, Marco... - p. xv-xviii , 2022
 
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7

Economic Perspectives on Individual Well-being:

, In: Wohlbefinden und Gesundheit im Jugendalter,
 
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8

Analysis and Design of a Fully-Integrated Pulsed LiDAR Driv..:

, In: 2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME),
 
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9

Cross-sectional SEM-EBIC analysis of semi-vertical GaN powe..:

, In: 2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM),
Priesol, J. ; Satka, A. ; Borga, M.... - p. 1-6 , 2022
 
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12

Edù, a Robotic Companion in Pediatric Protective Isolation ..:

, In: Education in & with Robotics to Foster 21st-Century Skills; Studies in Computational Intelligence,
 
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13

200 V GaN-on-SOI Smart Power Platform for Monolithic GaN Po..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Cosnier, T. ; Syshchyk, O. ; De Jaeger, B.... - p. 5.1.1-5.1.4 , 2021
 
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14

Development of a Robotic Agent for Increasing Elderlies Soc..:

, In: Education in & with Robotics to Foster 21st-Century Skills; Studies in Computational Intelligence,
 
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15

Demonstration of Bilayer Gate Insulator for Improved Reliab..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
 
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