Briggs, B
53  Ergebnisse:
Personensuche X
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1

Forksheet FETs with Bottom Dielectric Isolation, Self-Align..:

, In: 2022 International Electron Devices Meeting (IEDM),
Mertens, H. ; Ritzenthaler, R. ; Oniki, Y.... - p. 23.1.1-23.1.4 , 2022
 
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2

Scaled FinFETs Connected by Using Both Wafer Sides for Rout..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Veloso, A. ; Jourdain, A. ; Radisic, D.... - p. 284-285 , 2022
 
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3

Comparison of Electrical Performance of Co-Integrated Forks..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ritzenthaler, R. ; Mertens, H. ; Eneman, G.... - p. 26.2.1-26.2.4 , 2021
 
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4

Inspection and metrology challenges for 3 nm node devices a..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Shohjoh, T. ; Ikota, M. ; Isawa, M.... - p. 3.3.1-3.3.4 , 2021
 
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6

Buried Power Rail Integration with Si FinFETs for CMOS Scal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Gupta, A. ; Mertens, H. ; Tao, Z.... - p. 1-2 , 2020
 
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7

Three-Layer BEOL Process Integration with Supervia and Self..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Vega-Gonzalez, V. ; Bekaert, J. ; Kesters, E.... - p. 19.3.1-19.3.4 , 2019
 
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8

Petroleum Industry Activities and Human Health:

, In: The Political Ecology of Oil and Gas Activities in the Nigerian Aquatic Ecosystem,
Briggs, I. Lucky ; Briggs, B. Chidinma - p. 143-147 , 2018
 
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9

List of Contributors:

, In: The Political Ecology of Oil and Gas Activities in the Nigerian Aquatic Ecosystem,
 
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10

Gastroesophageal Reflux Disease and Hiatal Hernia:

, In: Fundamentals of Pediatric Surgery,
Briggs, Kayla B. ; St Peter, Shawn D. - p. 537-542 , 2022
 
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11

Appendicitis:

, In: Fundamentals of Pediatric Surgery,
Briggs, Kayla B. ; St Peter, Shawn D. - p. 717-724 , 2022
 
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12

Toxicology issues related to the COVID–19 outbreak:

, In: Toxicological Risk Assessment and Multi-System Health Impacts from Exposure,
 
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13

List of contributors:

, In: Toxicological Risk Assessment and Multi-System Health Impacts from Exposure,
 
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14

Demonstration of a Stacked CMOS Inverter at 60nm Gate Pitch..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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15

Developing a Crossed-Field Test Structure with Gate Field E..:

, In: 2023 IEEE International Conference on Plasma Science (ICOPS),
Del Rio, C. Segura ; Oberbeck, C. ; Briggs, R.... - p. 1-1 , 2023
 
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