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X
Chan, Justin YH.
4  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

LADA methodologies to localize embedded memory failure:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Yeoh, BL ; Thor, MH ; Gan, LS.. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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2

Significance of pre- and post- EFI data processing to enhan..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Yeoh, BL ; Thor, MH ; Goh, SH... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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3

Improving dynamic Optical Beam Induced Resistance Change Me..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Thor, MH ; Yeoh, BL ; Goh, SH. - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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4

Accurate Memory Bitmapping based on Built-in Self-Test: Cha..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Zhao, Lin ; Ngow, YT ; Goh, SH... - p. 1-8 , 2019
Link: https://doi.org/10.1109/..
 
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