Chao, Tzu-Yuan
194  Ergebnisse:
Personensuche X
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1

Exercise Space Planning and Design for an Aging Society:

, In: The Routledge Handbook of People and Place in the 21st-Century City,
Chao, Tzu-Yuan Stessa ; Chou, Yun - p. 98-108 , 2019
 
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2

Hardware Accelerator for MobileViT Vision Transformer with ..:

, In: 2024 IEEE International Symposium on Circuits and Systems (ISCAS),
 
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3

Building high performance transistors on carbon nanotube ch..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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4

Low N-Type Contact Resistance to Carbon Nanotubes in Highly..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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5

Continuous space pattern reduction for genetic clustering a..:

, In: Proceedings of the 14th annual conference companion on Genetic and evolutionary computation,
Tsai, Chun-Wei ; Lin, Tzu-Yuan ; Chiang, Ming-Chao.. - p. 1475-1476 , 2012
 
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6

Interactive Visual Exploration of Knowledge Graphs with Emb..:

, In: Extended Abstracts of the 2023 CHI Conference on Human Factors in Computing Systems,
 
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7

NTIRE 2020 Challenge on NonHomogeneous Dehazing:

, In: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
 
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8

Towards Efficient Neural Network on Edge Devices via Statis..:

, In: 2020 IEEE 9th Global Conference on Consumer Electronics (GCCE),
 
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9

Quad-Partitioning-Based Robotic Arm Guidance Based on Image..:

, In: Intelligent Information and Database Systems; Lecture Notes in Computer Science,
Kuo, Chen-Ju ; Wang, Ding-Chau ; Lee, Pin-Xin... - p. 152-164 , 2019
 
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10

Improving Defect Inspection Quality of Deep-Learning Networ..:

, In: 2019 IEEE International Conference on Systems, Man and Cybernetics (SMC),
Kuo, Cheng-Ju ; Chen, Chao-Chun ; Wang, Ding-Chau... - p. 798-805 , 2019
 
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11

A Case of Plasma-Induced Film Breakdown in 3D NAND BEOL Die..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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12

The Constraint Artificial-Intelligence Assisted Method for ..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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13

Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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14

Common Source Line-to-Word Line Short Improvement by Elimin..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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15

Improvement of Twisting and Line-Edge Roughness of 3D NAND ..:

, In: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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