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Chao, Wei-An
308  Ergebnisse:
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1

Maximum F1-Score Training for End-to-End Mispronunciation D..:

, In: 2022 IEEE International Conference on Multimedia and Expo (ICME),
Yan, Bi-Cheng ; Wang, Hsin-Wei ; Jiang, Shao-Wei Fan.. - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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2

Novel Control Design for Piezoelectric Stage to Achieve Fas..:

, In: 2022 International Automatic Control Conference (CACS),
Wu, Jim-Wei ; Weng, Jui-Tse ; Hsu, Ting-Kuei.. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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3

The Fuel Cell Flow channel design on Metallic Bipolar plate:

, In: 2019 IEEE Eurasia Conference on IOT, Communication and Engineering (ECICE),
Hung, Chien-Ju ; Chen, Wei-Jen ; Lin, Chao-An - p. 179-182 , 2019
Link: https://doi.org/10.1109/..
 
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4

Prediction of secondary flow structure in turbulent Couette..:

, In: Parallel Computational Fluid Dynamics 2006,
Lo, Wei ; Lin, Chao-An - p. 173-180 , 2007
Link: https://doi.org/10.1016/..
 
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5

Large Eddy Simulation of turbulent Couette-Poiseuille flows..:

, In: Parallel Computational Fluid Dynamics 2005,
Lo, Wei ; Lin, Chao-An - p. 117-124 , 2006
Link: https://doi.org/10.1016/..
 
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6

A near wall pressure treatment for Large Eddy Simulation:

, In: Parallel Computational Fluid Dynamics 2004,
Lo, Wei ; Lin, Chao-An - p. 61-68 , 1996
Link: https://doi.org/10.1016/..
 
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7

Implementation of a Deep Learning-Based Application for Wor..:

, In: Frontier Computing on Industrial Applications Volume 4; Lecture Notes in Electrical Engineering,
Chan, Yu-Wei ; Tseng, Yi-Cyuan ; Chen, Yu-An... - p. 204-210 , 2024
Link: https://doi.org/10.1007/..
 
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8

Pattern Generation for Efficient Acceptability Verification..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Chao, Wei-Ji ; Kourfali, Alexandra ; Lylina, Natalia... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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9

Status and Performance of Integration Modules Toward Scaled..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chou, Ang-Sheng ; Hsu, Ching-Hao ; Lin, Yu-Tung... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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10

Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Chang, Chih-Chin ; Hsiao, Ching-Hung ; Chen, Yi-Che... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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11

A Wi-Fi Tri-band switchable Transceiver with 57.9fs-RMS-jit..:

, In: 2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
Chen, Tsung-Ming ; Liu, Ming-Chung ; Wu, Pi-An... - p. 181-184 , 2023
Link: https://doi.org/10.1109/..
 
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12

AirCharge: Amplifying Ungrounded Impact Force by Accumulati..:

, In: Proceedings of the 36th Annual ACM Symposium on User Interface Software and Technology,
Chen, Po-Yu ; Tsai, Ching-Yi ; Wang, Wei-Hsin... - p. 1-11 , 2023
Link: https://dl.acm.org/doi/1..
 
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13

Wafer-Scale Bi-Assisted Semi-Auto Dry Transfer and Fabricat..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Li, Ming-Yang ; Hsu, Ching-Hao ; Shen, Shin-Wei... - p. 290-291 , 2022
Link: https://doi.org/10.1109/..
 
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14

High-Performance Monolayer WSe2 p/n FETs via Antimony-Plati..:

, In: 2022 International Electron Devices Meeting (IEDM),
Chou, Ang-Sheng ; Lin, Yu-Tung ; Lin, Yuxuan Cosmi... - p. 7.2.1-7.2.4 , 2022
Link: https://doi.org/10.1109/..
 
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15

Motion Reasoning for Goal-Based Imitation Learning:

, In: 2020 IEEE International Conference on Robotics and Automation (ICRA),
Huang, De-An ; Chao, Yu-Wei ; Paxton, Chris... - p. 4878-4884 , 2020
Link: https://doi.org/10.1109/..
 
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