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Chatterjee, Amarnath
17  Ergebnisse:
Buchkapitel (Online) X
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1

Signature Driven Post-Manufacture Testing and Tuning of RRA..:

, In: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC),
Saha, Anurup ; Amarnath, Chandramouli ; Ma, Kwondo. - p. 740-745 , 2024
Link: https://doi.org/10.1109/..
 
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2

DeepER-HD: An Error Resilient HyperDimensional Computing Fr..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Mejri, Mohamed ; Amarnath, Chandramouli ; Chatterjee, Abhijit - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Post-Manufacture Criticality-Aware Gain Tuning of Timing En..:

, In: 2024 IEEE European Test Symposium (ETS),
Saha, Anurup ; Ma, Kwondo ; Amarnath, Chandramouli. - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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4

Error Resilient Hyperdimensional Computing Using Hypervecto..:

, In: 2024 IEEE 42nd VLSI Test Symposium (VTS),
Mejri, Mohamed ; Amarnath, Chandramouli ; Chatterjee, Abhijit - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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5

Efficient Optimized Testing of Resistive RAM Based Convolut..:

, In: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Saha, Anurup ; Ma, Kwondo ; Amarnath, Chandramouli. - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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6

A Novel Approach to Error Resilience in Online Reinforcemen..:

, In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Amarnath, Chandramouli ; Chatterjee, Abhijit - p. 1-7 , 2023
Link: https://doi.org/10.1109/..
 
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7

Secure Control Loop Execution of Cyber-Physical Devices Usi..:

, In: 2023 24th International Symposium on Quality Electronic Design (ISQED),
Ma, Kwondo ; Amarnath, Chandramouli ; Chatterjee, Abhijit. - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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8

A Resilience Framework for Synapse Weight Errors and Firing..:

, In: 2023 IEEE European Test Symposium (ETS),
Saha, Anurup ; Amarnath, Chandramouli ; Chatterjee, Abhijit - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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9

Error Resilient Transformers: A Novel Soft Error Vulnerabil..:

, In: 2023 IEEE European Test Symposium (ETS),
Ma, Kwondo ; Amarnath, Chandramouli ; Chatterjee, Abhijit - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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10

Error Resilient Neuromorphic Systems Using Embedded Predict..:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
Amarnath, Chandramouli ; Chatterjee, Abhijit - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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11

Low Power Neural Network Accelerators Using Collaborative W..:

, In: 2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS),
Ma, Kwondo ; Mejri, Mohamed ; Amarnath, Chandramouli. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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12

Efficient Low Cost Alternative Testing of Analog Crossbar A..:

, In: 2022 IEEE International Test Conference (ITC),
Ma, Kwondo ; Saha, Anurup ; Amarnath, Chandramouli. - p. 499-503 , 2022
Link: https://doi.org/10.1109/..
 
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13

Soft Error Resilient Deep Learning Systems Using Neuron Gra..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Amarnath, Chandramouli ; Mejri, Mohamed ; Ma, Kwondo. - p. 1-7 , 2022
Link: https://doi.org/10.1109/..
 
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14

AMS Test Stimulus Generation and Response Analysis Using Hy..:

, In: 2024 IEEE European Test Symposium (ETS),
Komarraju, Suhasini ; Mejri, Mohamed ; Tammana, Akhil... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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15

OATT: Outlier Oriented Alternative Testing and Post-Manufac..:

, In: 2023 IEEE International Test Conference (ITC),
Komarraju, Suhasini ; Tammana, Akhil ; Amarnath, Chandramouli N. - p. 37-46 , 2023
Link: https://doi.org/10.1109/..
 
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