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2023 IEEE 41st VLSI Test Symposium (VTS) ,
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Special Session: Using Graph Neural Networks for Tier-Level..:
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2023 IEEE European Test Symposium (ETS) ,
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Test-Point Insertion for Power-Safe Testing of Monolithic 3..:
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2023 IEEE International Test Conference (ITC) ,
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Analysis and Characterization of Defects in FeFETs:
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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
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Securing Heterogeneous 2.5D ICs Against IP Theft through Dy..:
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2023 IEEE 41st VLSI Test Symposium (VTS) ,
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Innovation Practices Track: Testability and Dependability o..:
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2023 IEEE International Test Conference (ITC) ,
6
Scan Cell Segmentation Based on Reinforcement Learning for ..:
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2023 IEEE 41st VLSI Test Symposium (VTS) ,
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Functional Test Generation for AI Accelerators using Bayesi..:
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2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
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Structural Test Generation for AI Accelerators using Neural..:
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2022 IEEE European Test Symposium (ETS) ,
9
TaintLock: Preventing IP Theft through Lightweight Dynamic ..:
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2022 IEEE International Test Conference (ITC) ,
10
Automatic Structural Test Generation for Analog Circuits us..:
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2022 IEEE International Test Conference (ITC) ,
11
Fault Diagnosis for Resistive Random-Access Memory and Mono..:
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Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design ,
12
Machine Learning for Testing Machine-Learning Hardware :..:
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2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ,
13
Probabilistic Fault Grading for AI Accelerators using Neura..:
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2022 IEEE 40th VLSI Test Symposium (VTS) ,
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Special Session: Fault Criticality Assessment in AI Acceler..:
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2021 IEEE International Test Conference in Asia (ITC-Asia) ,
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