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Chaudhuri, Arjun
25  Ergebnisse:
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1

Special Session: Using Graph Neural Networks for Tier-Level..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Hung, Shao-Chun ; Chaudhuri, Arjun ; Banerjee, Sanmitra. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

Test-Point Insertion for Power-Safe Testing of Monolithic 3..:

, In: 2023 IEEE European Test Symposium (ETS),
Hung, Shao-Chun ; Chaudhuri, Arjun ; Chakrabarty, Krishnendu - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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3

Analysis and Characterization of Defects in FeFETs:

, In: 2023 IEEE International Test Conference (ITC),
Thapar, Dhruv ; Thomann, Simon ; Chaudhuri, Arjun.. - p. 256-265 , 2023
Link: https://doi.org/10.1109/..
 
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4

Securing Heterogeneous 2.5D ICs Against IP Theft through Dy..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Talukdar, Jonti ; Chaudhuri, Arjun ; Kim, Jinwoo.. - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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5

Innovation Practices Track: Testability and Dependability o..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Su, Fei ; Zhang, Eric ; Chaudhuri, Arjun. - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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6

Scan Cell Segmentation Based on Reinforcement Learning for ..:

, In: 2023 IEEE International Test Conference (ITC),
Hung, Shao-Chun ; Chaudhuri, Arjun ; Banerjee, Sanmitra. - p. 216-225 , 2023
Link: https://doi.org/10.1109/..
 
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7

Functional Test Generation for AI Accelerators using Bayesi..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Chaudhuri, Arjun ; Chen, Ching-Yuan ; Talukdar, Jonti. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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8

Structural Test Generation for AI Accelerators using Neural..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Chaudhuri, Arjun ; Banerjee, Sanmitra ; Chakrabarty, Krishnendu - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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9

TaintLock: Preventing IP Theft through Lightweight Dynamic ..:

, In: 2022 IEEE European Test Symposium (ETS),
Talukdar, Jonti ; Chaudhuri, Arjun ; Chakrabarty, Krishnendu - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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10

Automatic Structural Test Generation for Analog Circuits us..:

, In: 2022 IEEE International Test Conference (ITC),
Talukdar, Jonti ; Chaudhuri, Arjun ; Bhattacharya, Mayukh. - p. 145-154 , 2022
Link: https://doi.org/10.1109/..
 
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11

Fault Diagnosis for Resistive Random-Access Memory and Mono..:

, In: 2022 IEEE International Test Conference (ITC),
Hung, Shao-Chun ; Chaudhuri, Arjun ; Banerjee, Sanmitra. - p. 118-127 , 2022
Link: https://doi.org/10.1109/..
 
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12

Machine Learning for Testing Machine-Learning Hardware :..:

, In: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design,
Chaudhuri, Arjun ; Talukdar, Jonti ; Chakrabarty, Krishnendu - p. 1-6 , 2022
Link: https://dl.acm.org/doi/1..
 
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13

Probabilistic Fault Grading for AI Accelerators using Neura..:

, In: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI),
Chaudhuri, Arjun ; Talukdar, Jonti ; Chakrabarty, Krishnendu - p. 333-338 , 2022
Link: https://doi.org/10.1109/..
 
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14

Special Session: Fault Criticality Assessment in AI Acceler..:

, In: 2022 IEEE 40th VLSI Test Symposium (VTS),
Chaudhuri, Arjun ; Talukdar, Jonti ; Chakrabarty, Krishnendu - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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15

Testing and Fault-Localization Solutions for Monolithic 3D ..:

, In: 2021 IEEE International Test Conference in Asia (ITC-Asia),
Chaudhuri, Arjun ; Chakrabarty, Krishnendu - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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