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2023 Sixth International Symposium on Computer, Consumer and Control (IS3C) ,
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Self-training and Label Propagation for Semi-supervised Cla..:
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2022 IEEE/WIC/ACM International Joint Conference on Web Intelligence and Intelligent Agent Technology (WI-IAT) ,
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Patient History Summarization on Outpatient Conversation:
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2024 IEEE International Solid-State Circuits Conference (ISSCC) ,
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15.9 A 16nm 16Mb Embedded STT-MRAM with a 20ns Write Time, ..:
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2022 IEEE 5th International Conference on Knowledge Innovation and Invention (ICKII ) ,
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Increasing Transfer Rate of Sunlight Communication System U..:
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Definitions of Biomaterials for the Twenty-First Century ,
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Attendees at Chengdu Definitions in Biomaterials Conference..:
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2019 International Conference on Optical MEMS and Nanophotonics (OMN) ,
6
3D-Printed and PDLC-Tuned Corner Cube RetroReflector for Su..:
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Sustainability Through Innovation in Product Life Cycle Design; EcoProduction ,
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Key Success Factors of Green Innovation for Transforming Tr..:
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ICC 2020 - 2020 IEEE International Conference on Communications (ICC) ,
8
Efficient Group Fault Tolerance for Multi-tier Services in ..:
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2019 IEEE Global Communications Conference (GLOBECOM) ,
9
An Efficient Algorithm for Fully Distributed Sequential Cha..:
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Lecture Notes in Computer Science; Innovative Technologies and Learning ,
10
Exploring the Impact of Artificial Intelligence Learning Pl..:
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2012 IEEE 6th International Conference on Nano/Molecular Medicine and Engineering (NANOMED) ,
11
Rapid detection of influenza infection with magnetic MnFe2O..:
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2023 IEEE International Symposium on Information Theory (ISIT) ,
12
On characterizing optimal Wasserstein GAN solutions for non..:
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Lecture Notes in Computer Science; Human Interface and the Management of Information ,
13
Using Interactive Flat Panel Display for STEM Education Bas..:
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2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
14
Si Metal-Oxide-Semiconductor and Si/SiGe Heterostructure Qu..:
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2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ,
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