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1

AI-assisted ISP hyperparameter auto tuning:

, In: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS),
Xu, Fa ; Liu, Zihao ; Lu, Yanheng... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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2

2022 ICCAD CAD Contest Problem C : Microarchitecture Des..:

, In: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design,
Li, Sicheng ; Bai, Chen ; Wei, Xuechao... - p. 1-7 , 2022
Link: https://dl.acm.org/doi/1..
 
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3

ICE: An Intelligent Cognition Engine with 3D NAND-based In-..:

, In: 2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO),
Hu, Han-Wen ; Wang, Wei-Chen ; Chang, Yuan-Hao... - p. 763-783 , 2022
Link: https://doi.org/10.1109/..
 
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4

A 512Gb In-Memory-Computing 3D-NAND Flash Supporting Simila..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
Hu, Han-Wen ; Wang, Wei-Chen ; Chen, Chung-Kuang... - p. 138-140 , 2022
Link: https://doi.org/10.1109/..
 
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5

Orchestrating Medical Image Compression and Remote Segmenta..:

, In: Lecture Notes in Computer Science; Medical Image Computing and Computer Assisted Intervention – MICCAI 2020,
Liu, Zihao ; Li, Sicheng ; Chen, Yen-kuang... - p. 406-416 , 2020
Link: https://doi.org/10.1007/..
 
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6

Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Chang, Chih-Chin ; Hsiao, Ching-Hung ; Chen, Yi-Che... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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7

Advanced Inspection Methodology for the Maximum Extension o..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Ke, Yu-Yuan ; Chen, Kuang-Hsiu ; Chen, Shin-Ru... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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8

A $X-/K_{\mathrm{u}}$-Band QFN-Packaged GaAs LNA Supporting..:

, In: 2019 IEEE Asia-Pacific Microwave Conference (APMC),
Wang, Chun ; Chen, Kuang-Yu ; Lee, Yu-Ling. - p. 1521-1523 , 2019
Link: https://doi.org/10.1109/..
 
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9

A Low-Power Low-Latency 84.5-GHz GaAs pHEMT Self-Injection-..:

, In: 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024,
Gao, Donglin ; Li, Shuping ; Zhu, Minning.. - p. 899-902 , 2024
Link: https://doi.org/10.1109/..
 
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10

A W-band Self-Injection-Locked Vital Sign Radar Sensor with..:

, In: 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023,
Gao, Donglin ; Li, Shuping ; Chen, Austin Ying-Kuang. - p. 871-874 , 2023
Link: https://doi.org/10.1109/..
 
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11

A Smartphone-Based Portable System for Rapid Detection of P..:

, In: 2019 IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS),
Ma, Yu-Dong ; Li, Kuang-Hsien ; Chen, Yi-Hong... - p. 75-78 , 2019
Link: https://doi.org/10.1109/..
 
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12

A Novel Multi-scale Key-Point Detector Using Residual Dense..:

, In: Lecture Notes in Computer Science; Neural Information Processing,
Kuang, Li-Dan ; Tao, Jia-Jun ; Zhang, Jianming.. - p. 235-246 , 2021
Link: https://doi.org/10.1007/..
 
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13

ASKDetector: An AST-Semantic and Key Features Fusion based ..:

, In: Proceedings of the 32nd IEEE/ACM International Conference on Program Comprehension,
Yang, Haiyang ; Chen, Hao ; Kuai, Zhirui.. - p. 392-402 , 2024
Link: https://dl.acm.org/doi/1..
 
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14

Simulation of Solder Crack Phenomenon in Molding Process:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Chien, Tzu Chieh ; Li, Zong Yuan ; Lo, Shih Kun... - p. 1959-1963 , 2023
Link: https://doi.org/10.1109/..
 
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15

The Phenomenon of Tunnel Structure Mold Flowability Experim..:

, In: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC),
Lo, Shih Kun ; Su, Yi Hsun ; Li, Zong Yuan... - p. 764-769 , 2023
Link: https://doi.org/10.1109/..
 
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