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2020 IEEE International Test Conference in Asia (ITC-Asia) ,
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Test Methodology for Defect-based Bridge Faults:
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2019 Joint International Symposium on e-Manufacturing & Design Collaboration(eMDC) & Semiconductor Manufacturing (ISSM) ,
2
Mining Factors Impact Wafer Circuit Probing Via Neural Netw..:
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2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) ,
3
Decision-Based Virtual Metrology Framework to Improve the E..:
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2021 International Conference on System Science and Engineering (ICSSE) ,
4
Internet of Things Applied to Bicycle Power Generation Syst..:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
5
Mask Generation with Meta-Learning Classifier Weight Transf..:
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2023 IEEE International Conference on Image Processing (ICIP) ,
6
3D Face Reconstruction Based on Weakly-Supervised Learning ..:
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2023 9th International Conference on Applied System Innovation (ICASI) ,
7
A Skin Type Classification Method Using Mobile Device-Based..:
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Pattern Recognition and Artificial Intelligence; Lecture Notes in Computer Science ,
8
Clinical Decision Support Systems for Predicting Patients L..:
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2019 IEEE 8th Global Conference on Consumer Electronics (GCCE) ,
9
Air-Writing for Smart Glasses by Effective Fingertip Detect..:
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2019 IEEE International Conference on Systems, Man and Cybernetics (SMC) ,
10
Improving Defect Inspection Quality of Deep-Learning Networ..:
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Proceedings of the Conference on Design, Automation and Test in Europe ,
12
A probabilistic analysis method for functional qualificatio..:
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2022 International Conference on System Science and Engineering (ICSSE) ,
13
Apply Adaptive Neural Network PID Controllers for a 6DOF Ro..:
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2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
14
An activity-sensitive contention delay model for highly eff..:
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Proceedings of the conference on Design, Automation & Test in Europe ,
15