Chih-Yao Chung
648  Ergebnisse:
Personensuche X
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1

A low complexity crossover digital predistorter for compens..:

, In: IET International Conference on Information and Communications Technologies (IETICT 2013),
Chung-Lung Lee ; Li-Chung Chang ; Chih-Yao Huang - p. 528-533 , 2013
 
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2

A 12-nm 0.62-1.61 mW Ultra-Low Power Digital CIM-based Deep..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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3

7.1 A 3.4-to-13.3TOPS/W 3.6TOPS Dual-Core Deep-Learning Acc..:

, In: 2020 IEEE International Solid- State Circuits Conference - (ISSCC),
Lin, Chien-Hung ; Cheng, Chih-Chung ; Tsai, Yi-Min... - p. 134-136 , 2020
 
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5

Rare cells detection by selective enrichment with a novel m..:

, In: The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS),
Chen, Chih-Chung ; Chen, Yu-An ; Yao, Da-Jeng - p. 407-410 , 2014
 
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6

U-MRAM PUF: A Novel Unipolar-MRAM for Power and Area Effici..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Shih, Ching ; Hong, Ming-Chun ; Wang, Chih-Yao... - p. 1-2 , 2024
 
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7

U-MRAM: Transistor-Less, High-Speed (10 ns), Low-Voltage (0..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Wu, Ming-Hung ; Hong, Ming-Chun ; Shih, Ching... - p. 1-2 , 2023
 
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8

Structure and Performance Co-optimization for the Developme..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
 
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9

A 4K–400K Wide Operating-Temperature-Range MRAM Technology ..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Hong, Ming-Chun ; Chang, Yao-Jen ; Hsin, Yu-Chen... - p. 379-380 , 2022
 
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10

20.1 NVE: A 3nm 23.2TOPS/W 12b-Digital-CIM-Based Neural Eng..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Shih, Ming-En ; Hsieh, Shih-Wei ; Tsai, Ping-Yuan... - p. 360-362 , 2024
 
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11

Benign Neoplasms of the Small Intestines:

, In: Atlas of Small Intestinal Disorders,
 
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12

Post-Etch Yield Killer Defects in 3D NAND High Aspect Ratio..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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13

CPGAN: Collective Punishment Generative Adversarial Network..:

, In: 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS),
Su, Yu-Chi ; Chiu, Ching-Te ; Cheng, Chih-Han... - p. 1-5 , 2023
 
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14

Common Source Line-to-Word Line Short Improvement by Elimin..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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15

Hierarchical Cache Transformer: Dynamic Early Exit for Lang..:

, In: 2022 International Joint Conference on Neural Networks (IJCNN),
 
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