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Chou, Leo Y. T.
46  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Dislocation Energies in Anisotropic Trigonal Crystals:

, In: August 16,
Chou, Y. T. ; Sha, G. T. - p. 505-514 , 1971
Link: https://doi.org/10.1515/..
 
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2

Edge Dislocations in Semi-Infinite Anisotropic Media:

, In: August 16,
Pande, C. S. ; Chou, Y. T. - p. 499-504 , 1971
Link: https://doi.org/10.1515/..
 
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3

On Stacked Screw Dislocation Arrays in an Anisotropic Mediu:

, In: March 1,
Chou, Y. T. - p. 285-290 , 1967
Link: https://doi.org/10.1515/..
 
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4

Contributors:

, In: Pain Management,
Abdelhalim, Ahmed N. ; Abdi, Salahadin ; Abrams, Bernard M.... - p. vii-xii , 2007
Link: https://doi.org/10.1016/..
 
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5

Complementary Field-Effect Transistor (CFET) Demonstration ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Liao, S. ; Yang, L. ; Chiu, T.K.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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6

An approach to embedding traditional non-volatile memories ..:

, In: 2020 IEEE Symposium on VLSI Technology,
Lin, C. S. ; Huang, W.T. ; Huang, Allan... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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7

Contributors:

, In: Genetic Diseases of the Kidney,
Antignac, Corinne ; Aronson, Peter S. ; Asch, William S.... - p. xi-xiii , 2009
Link: https://doi.org/10.1016/..
 
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8

CONTRIBUTORS:

, In: Roy and Fraunfelder's Current Ocular Therapy,
Abbott, Richard L. ; Afshari, Natalie A. ; Agrawal, Jaya... - p. xvi-xxxv , 2008
Link: https://doi.org/10.1016/..
 
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9

Device Study on OTS-PCM for Persistent Memory Application :..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chien, W. C. ; Gignac, L. M. ; Chou, Y. C.... - p. 327-329 , 2022
Link: https://doi.org/10.1109/..
 
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10

Optimizing AsSeGe Chalcogenides by Dopants for Extremely Lo..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Cheng, H. Y. ; Chien, W C. ; Kuo, I. T.... - p. 28.6.1-28.6.4 , 2021
Link: https://doi.org/10.1109/..
 
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11

Si Incorporation Into AsSeGe Chalcogenides for High Thermal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Cheng, H. Y. ; Kuo, I. T. ; Chien, W C.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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12

The Effect of Gate Current on the Degradation of GaAs PHEMT..:

, In: [Reliability of Compound Semiconductors] ROCS Workshop 2006,
Chou, Y. C. ; Chin, P. ; Wojtowicz, M.... - p. None , 2006
Link: https://doi.org/10.1109/..
 
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13

Structure, Pretreatment and Hydrolysis of Cellulose:

, In: Bioenergy,
Chang, Martin M. ; Chou, Terry Y. C. ; Tsao, George T. - p. 15-42 , 1981
Link: https://doi.org/10.1515/..
 
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14

Bi Segregation in the Solid/Liquid Cu-0.1 wt.% Fe (C19210)/..:

, In: 2024 International Conference on Electronics Packaging (ICEP),
Laksono, A. D ; Chou, J. T. ; Yen, Y. W. - p. 301-302 , 2024
Link: https://doi.org/10.23919..
 
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15

Dissolution Behavior of Cu-0.1wt.% Fe C19210 in Molten Sn &..:

, In: 2024 International Conference on Electronics Packaging (ICEP),
Laksono, A. D ; Chou, J. T. ; Yen, Y. W. - p. 19-20 , 2024
Link: https://doi.org/10.23919..
 
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