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Cluzel, J
19  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Comparative experimental study of junctionless and inversio..:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Bosch, D. ; Colinge, J.P. ; Lugo, J.... - p. 126-127 , 2020
Link: https://doi.org/10.1109/..
 
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2

All-operation-regime characterization and modeling of drain..:

, In: 2020 IEEE Symposium on VLSI Technology,
Bosch, D. ; Colinge, J.P. ; Ghibaudo, G.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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3

A Very Robust and Reliable 2.7GHz +31dBm Si RFSOI Transisto..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Garros, X. ; Cacho, F. ; Vincent, E.... - p. 25.5.1-25.5.4 , 2019
Link: https://doi.org/10.1109/..
 
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4

Investigation of nBTI degradation on GaN-on-Si E-mode MOSc-..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Viey, A.G. ; Vandendaele, W. ; Jaud, M.-A.... - p. 4.3.1-4.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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5

Back-bias impact on variability and BTI for 3D-monolithic 1..:

, In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS),
Bosch, D. ; Andrieu, F. ; Garros, X.... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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6

Novel Fine-Grain Back-Bias Assist Techniques for 14nm FDSOI..:

, In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA),
Bosch, D. ; Andrieu, F. ; Ciampolini, L.... - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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7

25nm Short and Narrow Strained FDSOI with TiN/HfO2 Gate Sta..:

, In: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.,
Deleonibus, S. ; Mazure, C. ; Gaud, P.... - p. 134-135 , 2006
Link: https://doi.org/10.1109/..
 
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8

Implementation of a National Wastewater Surveillance System..:

, In: Wastewater Surveillance for Covid-19 Management; The Handbook of Environmental Chemistry,
Boni, M. ; Wurtzer, S. ; Mouchel, J. M.... - p. 133-161 , 2023
Link: https://doi.org/10.1007/..
 
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9

NEUROPULS: NEUROmorphic energy-efficient secure accelerator..:

, In: 2023 IEEE European Test Symposium (ETS),
Pavanello, Fabio ; Marchand, Cedric ; O'Connor, Ian... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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10

Layered Formal Verification of a TCP Stack:

, In: 2021 IEEE Secure Development Conference (SecDev),
Cluzel, Guillaume ; Georgiou, Kyriakos ; Moy, Yannick. - p. 86-93 , 2021
Link: https://doi.org/10.1109/..
 
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11

Hot Electrons Remote Excitation and their Ultrafast Dynamic:

, In: 2021 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC),
Hernandez, Romain ; Juliano-Martins, Renato ; Lodari, Mario... - p. 1-1 , 2021
Link: https://doi.org/10.1109/..
 
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12

A Method for the Quantification of Architectural Anisotropy..:

, In: Advanced Structured Materials; Developments and Novel Approaches in Biomechanics and Metamaterials,
Rogalski, Nicolas ; Cluzel, Christophe ; Laporte, Sébastien - p. 153-162 , 2020
Link: https://doi.org/10.1007/..
 
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13

Automated 3D MRI Aortic Morphometry Demonstrates the Added ..:

, In: 2019 Computing in Cardiology (CinC),
Dietenbeck, Thomas ; Houriez--Gombaud-Saintonge, Sophia ; Gencer, Umit... - p. Page 1-Page 4 , 2019
Link: https://doi.org/10.22489..
 
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14

Face Hallucination Revisited: An Exploratory Study on Datas..:

, In: 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
Grm, Klemen ; Pernus, Martin ; Cluzel, Leo... - p. 2405-2413 , 2019
Link: https://doi.org/10.1109/..
 
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15

On-Chip Periodic Arrays of Optical Traps Based on the Super..:

, In: 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC),
Pin, Christophe ; Jager, Jean-Baptiste ; Tardif, Manon... - p. 1-1 , 2019
Link: https://doi.org/10.1109/..
 
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