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Reliability of Organic Compounds in Microelectronics and Optoelectronics ,
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Degradation and Remaining Useful Life Prediction of Automot..:
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2019 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) ,
2
Preparation and Properties of 3D Screen-Printed RF Componen..:
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2006 1st Electronic Systemintegration Technology Conference ,
3
Identifying the Reliability Affecting Parameters of SBB Fli..:
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Springer Proceedings in Physics; Basic Concepts in Nuclear Physics: Theory, Experiments and Applications ,
6
Measurement of the $$^{244}$$ 244 Cm and $$^{246}$$ 246 Cm ..:
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Springer Proceedings in Physics; Nuclei in the Cosmos XV ,
7
Data for the s Process from n_TOF:
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Springer Proceedings in Physics; Basic Concepts in Nuclear Physics: Theory, Experiments and Applications ,
8
Characterization and First Test of an i-TED Prototype at CE..:
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Springer Proceedings in Physics; Nuclei in the Cosmos XV ,
9
$$^{7}$$ Be(n,p) $$^{7}$$ Li Cross Section Measurement for ..:
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2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 ,
11
Rear-surface passivation technology for crystalline silicon..:
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Springer Proceedings in Physics; Narrow Gap Semiconductors 2007 ,
14
Conduction Band States in AlP/GaP Quantum Wells:
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2007 IEEE Particle Accelerator Conference (PAC) ,
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