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X
Ervin, Vincent J.
4  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Metal-Oxide-Metal Capacitor Simulation and Modeling by Virt..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),
Wang, Qingpeng ; Zhong, Yu Jia ; Deng, Quan... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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2

Important Process Parameter and Its Sensitivity Check By Vi..:

, In: 2023 China Semiconductor Technology International Conference (CSTIC),
Wang, Qingpeng ; Lyu, Pengfei ; Sun, Lifei... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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3

Pathfinding by Process Window Modeling: Advanced Dram Capac..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
Wang, Qingpeng ; De Chen, Yu ; Huang, Jacky.. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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4

A Benchmark Study of Complementary-Field Effect Transistor ..:

, In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S),
Vincent, Benjamin ; Ervin, J. ; Boemmels, J.. - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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