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Eyben, P.
6  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Towards Improved Nanosheet-Based Complementary Field Effect..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chiarella, T. ; Matagne, P. ; Mertens, H.... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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2

Comparison of Electrical Performance of Co-Integrated Forks..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ritzenthaler, R. ; Mertens, H. ; Eneman, G.... - p. 26.2.1-26.2.4 , 2021
Link: https://doi.org/10.1109/..
 
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3

3D-carrier Profiling and Parasitic Resistance Analysis in V..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Eyben, P. ; Machillot, J. ; Kim, M.... - p. 11.3.1-11.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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4

Dopant and carrier profiling in FinFET-based devices with s..:

, In: 2010 Symposium on VLSI Technology,
Mody, J. ; Kambham, A.K. ; Zschatzsch, G.... - p. 195-196 , 2010
Link: https://doi.org/10.1109/..
 
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5

Superior N- and PMOSFET scalability using carbon co-implant..:

, In: 2006 European Solid-State Device Research Conference,
Augendre, E. ; De Keersgieter, A. ; Eyben, P.... - p. None , 2006
Link: https://doi.org/10.1109/..
 
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6

Probing Semiconductor Technology and Devices with Scanning ..:

, In: Scanning Probe Microscopy,
Eyben, P. ; Vandervorst, W. ; Alvarez, D... - p. 31-87 ,
Link: https://doi.org/10.1007/..
 
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