Frost, Nicholas
3  Ergebnisse:
Personensuche X
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Enabling 300 mm Wafer-Scale Fabrication of Superconducting ..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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2

Plasma-induced roughness and chemical modifications of TiN ..:

, In: 2020 IEEE International Interconnect Technology Conference (IITC),
Rogalskyj, Sophia ; Frost, Hunter ; Palka, Amber... - p. 49-51 , 2020
 
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CONTRIBUTORS:

, In: Comprehensive Handbook of Alcohol Related Pathology,
Abel, Ernest ; Acquaah-Mensah, George ; Adachi, Junko... - p. xiii-xxvii , 2005
 
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