Frutuoso, Tadeu Mota
8  Ergebnisse:
Personensuche X
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1

Miniaturization of Transmission Lines: Meandered Slow-wave ..:

, In: 2020 IEEE MTT-S International Conference on Microwaves for Intelligent Mobility (ICMIM),
 
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2

Insight Into HCI Reliability on I/O Nitrided Devices:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Doyen, C. ; Yon, V. ; Garros, X.... - p. 1-5 , 2023
 
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3

Methodology for Active Junction Profile Extraction in thin ..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Frutuoso, T. Mota ; Garros, X. ; Batude, P.... - p. 332-333 , 2022
 
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4

3D sequential integration: applications and associated key ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Batude, P. ; Billoint, O. ; Thuries, S.... - p. 3.2.1-3.2.4 , 2021
 
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6

Capacitance RF Characterization and Modeling of 28 FD-SOI C..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
Berlingard, Q. ; Lugo-Alvarez, J. ; Bawedin, M.... - p. 37-40 , 2023
 
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7

3D sequential integration with Si CMOS stacked on 28nm indu..:

, In: 2023 International Electron Devices Meeting (IEDM),
Mota-Frutuoso, T. ; Lapras, V. ; Brunet, L.... - p. 1-4 , 2023
 
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