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X
Goto, Ken
21  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Temperature Dependence of the Anisotropic Dielectric Proper..:

, In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
Liu, Shuang ; Agulto, Verdad C. ; Iwamoto, Toshiyuki... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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2

Ion Implantation Doping Technology for Ga2O3 and Its Applic..:

, In: 2023 21st International Workshop on Junction Technology (IWJT),
Higashiwaki, Masataka ; Goto, Ken ; Murakami, Hisashi. - p. 1-4 , 2023
Link: https://doi.org/10.23919..
 
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3

Terahertz Time-Domain Ellipsometry of Heavily Doped β-Ga2 O:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),
Agulto, Verdad C. ; Iwamoto, Toshiyuki ; Wang, Youwei... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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4

Evaluation of Thermal Deformation of Fastening Structure of..:

, In: Thermomechanics & Infrared Imaging, Inverse Problem Methodologies, Mechanics of Additive & Advanced Manufactured Materials, and Advancements in Optical Methods & Digital Image Correlation, Volume 4; Conference Proceedings of the Society for Experimental Mechanics Series,
Fuchigami, Ayumu ; Yoneyama, Satoru ; Goto, Ken. - p. 41-44 , 2022
Link: https://doi.org/10.1007/..
 
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5

Operation Up to 600K of Vertical β-Ga2O3 Schottky Rectifier..:

, In: 2021 Device Research Conference (DRC),
Xia, Xinyi ; Xian, Minghan ; Carey, Patrick... - p. 1-2 , 2021
Link: https://doi.org/10.1109/..
 
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6

Phonon Properties: Phonon and Free Charge Carrier Propertie..:

, In: Gallium Oxide; Springer Series in Materials Science,
Schubert, Mathias ; Mock, Alyssa ; Korlacki, Rafał... - p. 501-534 , 2020
Link: https://doi.org/10.1007/..
 
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7

Halide Vapor Phase Epitaxy 1: Homoepitaxial Growth of β-Ga2..:

, In: Gallium Oxide; Springer Series in Materials Science,
Kumagai, Yoshinao ; Konishi, Keita ; Goto, Ken.. - p. 185-202 , 2020
Link: https://doi.org/10.1007/..
 
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8

Vertical Gallium Oxide Transistors with Current Aperture Fo..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Higashiwaki, Masataka ; Wong, Man Hoi ; Goto, Ken.. - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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9

Invited: Process and Characterization of Vertical Ga2O3 Tra..:

, In: 2019 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK),
Higashiwaki, Masataka ; Wong, Man Hoi ; Goto, Ken.. - p. 67-68 , 2019
Link: https://doi.org/10.1109/..
 
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10

$\beta$-Ga2O3 MOSFETs with Nitrogen-Ion-Implanted Back-Barr..:

, In: 2019 Compound Semiconductor Week (CSW),
Wong, Man Hoi ; Goto, Ken ; Murakami, Hisashi.. - p. 1-1 , 2019
Link: https://doi.org/10.1109/..
 
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11

Contributors:

, In: Ultra-Wide Bandgap Semiconductor Materials,
Chang, Xiaohui ; Chen, Dunjun ; Chen, Guangchao... - p. ix-x , 2019
Link: https://doi.org/10.1016/..
 
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12

First demonstration of vertical Ga2O3 MOSFET: Planar struct..:

, In: 2017 75th Annual Device Research Conference (DRC),
Wong, Man Hoi ; Goto, Ken ; Kuramata, Akito... - p. 1-2 , 2017
Link: https://doi.org/10.1109/..
 
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13

Study of Large Exposure Field Lithography for Advanced Chip..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Suda, Hiromi ; Shelton, Douglas ; Takada, Hiroki... - p. 2013-2017 , 2022
Link: https://doi.org/10.1109/..
 
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14

Visual Effect System for Projection Mapping with Japanese D..:

, In: 2022 Nicograph International (NicoInt),
Ishibashi, Ken ; Uchiyama, Shuta ; Goto, Hiroshi - p. 75-78 , 2022
Link: https://doi.org/10.1109/..
 
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15

Study of Submicron Patterning Exposure Tool for Fine 500 mm..:

, In: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
MORI, Ken-Ichiro ; SHELTON, Douglas ; GOTO, Yoshio... - p. 309-314 , 2020
Link: https://doi.org/10.1109/..
 
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