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Grill, Jessica I
10  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

List of contributors:

, In: Psychological and Medical Perspectives on Fertility Care and Sexual Health,
Arthur, Elizabeth K. ; Bindeman, Julie ; Covington, Laura... - p. xiii , 2022
Link: https://doi.org/10.1016/..
 
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2

Ergebnisse chirurgischer Klumpfußversorgung (Dorsale versus..:

, In: Langzeitergebnisse in der Kinderorthopädie,
Wrage-Brors, E. ; Müller, D. ; Kranzl, A... - p. 33-44 , 2003
Link: https://doi.org/10.1007/..
 
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3

On The Contribution of Secondary Holes in Hot-Carrier Degra..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Tyaginov, S.E. ; Bury, E. ; Grill, A.... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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4

Evidence of Tunneling Driven Random Telegraph Noise in Cryo..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Michl, J. ; Grill, A. ; Stampfer, B.... - p. 31.3.1-31.3.4 , 2021
Link: https://doi.org/10.1109/..
 
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5

Solid state qubits: how learning from CMOS fabrication can ..:

, In: 2021 Symposium on VLSI Circuits,
Radu, I. P. ; Li, R. ; Potocnik, A.... - p. 1-2 , 2021
Link: https://doi.org/10.23919..
 
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6

Quantum Mechanical Charge Trap Modeling to Explain BTI at C..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Michl, J. ; Grill, A. ; Claes, D.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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7

Reliability and Variability of Advanced CMOS Devices at Cry..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Grill, A. ; Bury, E. ; Michl, J.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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8

On the impact of mechanical stress on gate oxide trapping:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Kruv, A. ; Kaczer, B. ; Grill, A... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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9

Lightweight Hardware Implementation of VVC Transform Block ..:

, In: ICASSP 2020 - 2020 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP),
Farhat, I. ; Hamidouche, W. ; Grill, A... - p. 1663-1667 , 2020
Link: https://doi.org/10.1109/..
 
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10

High Performance 45-nm SOI Technology with Enhanced Strain,..:

, In: 2006 International Electron Devices Meeting,
Agnello, P. ; Ivers, T. ; Warm, C.... - p. None , 2006
Link: https://doi.org/10.1109/..
 
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