Harrison, Lee
83  Ergebnisse:
Personensuche X
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1

Scalable hierarchical DFT technologies for AI, SOC and mult..:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Harrison, Lee ; Yang, Wu - p. 1-1 , 2023
 
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2

Aerosol optical depth and direct-to-diffuse solar irradianc..:

, In: Nucleation and Atmospheric Aerosols 1996,
Laulainen, Nels ; Larson, Nels ; Min, Qilong... - p. 893-896 , 1996
 
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3

Clostridium difficile:

, In: Antimicrobial Resistance and Food Safety,
Marsh, Jane W. ; Harrison, Lee H. - p. 181-206 , 2015
 
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4

List of Contributors:

, In: Antimicrobial Resistance and Food Safety,
 
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7

Towards a practical inclusive design approach:

, In: Proceedings on the 2000 conference on Universal Usability,
 
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8

Exploring Effective Sensing Indicators of Loneliness For El..:

, In: Extended Abstracts of the 2024 CHI Conference on Human Factors in Computing Systems,
Ji, Xiayan ; Yuh, Ahhyun ; Erdélyi, Viktor... - p. 1-9 , 2024
 
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9

iCareLoop: Data Management System for Monitoring Gerontolog..:

, In: 2023 Fourteenth International Conference on Mobile Computing and Ubiquitous Network (ICMU),
Ji, Xiayan ; Yuh, Ahhyun ; Choi, Hyonyoung... - p. 1-6 , 2023
 
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10

L-UTSOI: A compact model for low-power analog and digital a..:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
 
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11

The food locker : an innovative, user-centered approach ..:

, In: Proceedings of the 37th ACM International Conference on the Design of Communication,
 
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12

Anomalous Mixed-Mode Damage Effects in SiGe HBTs at Cryogen..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
 
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13

The Effects of Carbon Doping on the Performance and Electri..:

, In: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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14

Improved Electrical Reliability and Performance Enhancement..:

, In: 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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15

Performance vs. Reliability Tradeoffs of Medium Breakdown a..:

, In: 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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