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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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A 12-nm 0.62-1.61 mW Ultra-Low Power Digital CIM-based Deep..:
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Proceedings of the 2021 CHI Conference on Human Factors in Computing Systems ,
2
Combining Touchscreens with Passive Rich-ID Building Blocks..:
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2019 Joint International Symposium on e-Manufacturing & Design Collaboration(eMDC) & Semiconductor Manufacturing (ISSM) ,
3
Optimizing Chiller Switch-on Time Interval for Chiller Powe..:
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2024 IEEE International Solid-State Circuits Conference (ISSCC) ,
4
34.2 A 16nm 96Kb Integer/Floating-Point Dual-Mode-Gain-Cell..:
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2023 IEEE International Solid- State Circuits Conference (ISSCC) ,
5
A 22nm 8Mb STT-MRAM Near-Memory-Computing Macro with 8b-Pre..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
6
A 28nm Nonvolatile AI Edge Processor using 4Mb Analog-Based..:
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2023 IEEE International Solid- State Circuits Conference (ISSCC) ,
7
A 22nm 832Kb Hybrid-Domain Floating-Point SRAM In-Memory-Co..:
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2022 IEEE International Solid- State Circuits Conference (ISSCC) ,
8
A 22nm 4Mb STT-MRAM Data-Encrypted Near-Memory Computation ..:
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2020 IEEE International Solid- State Circuits Conference - (ISSCC) ,
9
5.9 A 0.8V Multimode Vision Sensor for Motion and Saliency ..:
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2023 International Conference on Cyberworlds (CW) ,
10
Heart Rate Based Cross-subject Stress Recognition:
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2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV) ,
11
Improving Deep Facial Phenotyping for Ultra-rare Disorder V..:
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2023 IEEE Wireless Communications and Networking Conference (WCNC) ,
12
A Generative Adversarial Network Approach to Reflectarray P..:
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IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society ,
13
Maximum Torque Control Operating Points Estimation for Vari..:
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Nonlinear Structures & Systems, Volume 1; Conference Proceedings of the Society for Experimental Mechanics Series ,
14
Quantification of Amplitude- and Rotation Speed-Dependent N..:
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2023 IEEE International Electric Machines & Drives Conference (IEMDC) ,
15
An Alternative to Determine IM Parameters Trends Affected b..:
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