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2023 IEEE 32nd Asian Test Symposium (ATS) ,
1
Fault Simulation Acceleration Based on ARM Multi-core CPU A..:
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2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
2
Time-Dependent Dielectric Breakdown of Gate Oxide on 4H-SiC..:
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2018 OCEANS - MTS/IEEE Kobe Techno-Oceans (OTO) ,
3
Autonomous Underwater Vehicle Localization Using an Ocean A..:
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1-3