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Jamison, Wesley V
13  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Quality Assurance in E-Learning:

, In: Student Satisfaction and Learning Outcomes in E-Learning; Advances in Educational Marketing, Administration, and Leadership,
McCroskey, Stacey ; Kovach, Jamison V. ; Ding, Xin David.. - p. 231-248 , 2011
Link: https://doi.org/10.4018/..
 
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2

Longitudinally Polarized Terahertz Radiation from Spintroni..:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),
Lin, C.-H. ; Georgiadis, V. ; Bull, C.... - p. 1-1 , 2022
Link: https://doi.org/10.1109/..
 
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3

Terahertz diagnostic tool for sub-relativistic electron bea..:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),
Shaw, C. T. ; Finlay, O. ; Georgiadis, V.... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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4

Terahertz-driven acceleration of a relativistic 35 MeV elec..:

, In: 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
Hibberd, M. T. ; Walsh, D. A. ; Snedden, E. W.... - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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5

Characterizing the accelerating mode of a dielectric-lined ..:

, In: 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
Georgiadis, V. ; Hibberd, M.T. ; Healy, A.L.... - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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6

Contributors:

, In: Office Practice of Neurology,
Adams, Robert J. ; Albers, James W. ; Alderson, Lloyd M.... - p. vii-xx , 2003
Link: https://doi.org/10.1016/..
 
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7

Deep learning acceleration in 14nm CMOS compatible ReRAM ar..:

, In: 2022 International Electron Devices Meeting (IEDM),
Gong, N. ; Rasch, M.J. ; Seo, S.-C.... - p. 33.7.1-33.7.4 , 2022
Link: https://doi.org/10.1109/..
 
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8

Selective Enablement of Dual Dipoles for Near Bandedge Mult..:

, In: 2020 IEEE Symposium on VLSI Technology,
Bao, R. ; Watanabe, K. ; Zhang, J.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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9

Multiple-Vt Solutions in Nanosheet Technology for High Perf..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Bao, R. ; Watanabe, K. ; Zhang, J.... - p. 11.2.1-11.2.4 , 2019
Link: https://doi.org/10.1109/..
 
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10

Contributors:

, In: Critical Care Medicine,
Anderson, Robert J. ; Balk, Robert A. ; Barie, Philip S.... - p. vii-xiii , 2008
Link: https://doi.org/10.1016/..
 
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11

Band-Edge High-Performance High-k/Metal Gate n-MOSFETs Usin..:

, In: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.,
Chen, T.C. ; Shahidi, G. ; Guha, S.... - p. 178-179 , 2006
Link: https://doi.org/10.1109/..
 
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12

Systematic study of work function engineering and scavengin..:

, In: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.,
Kim, Y.H. ; Narayanan, V. ; Newbury, J.... - p. 4 pp. , 2005
Link: https://doi.org/10.1109/..
 
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13

Emergency Clinical Procedure Detection With Deep Learning:

, In: 2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC),
Li, Lingfeng ; Paris, Richard A. ; Pinson, Conner... - p. 158-163 , 2020
Link: https://doi.org/10.1109/..
 
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