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Jang, S Y
323  Ergebnisse:
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1

A study of CaMoO4 crystals for the AMoRE Experiment:

, In: 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC),
So, J. H. ; Kim, H. J. ; Alenkov, V. V.... - p. 1987-1990 , 2012
Link: https://doi.org/10.1109/..
 
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2

Attenuation correction for PET imaging using conditional de..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Dong, Y. ; Jang, S.-I. ; Han, P.... - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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3

TauPETGen: Text-Conditional Tau PET Image Synthesis Based o..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Jang, S.-I. ; Gomez, C. Lois ; Thibault, E.... - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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4

Ongoing Evolution of DRAM Scaling via Third Dimension -Vert..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Han, J.W. ; Park, S.H. ; Jeong, M.Y.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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5

Correlation Model for Size Measurement of Nanoparticles by ..:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Shim, Jimin ; Park, Y. H. ; Yim, Yong-Hyeon.. - p. 227-232 , 2023
Link: https://doi.org/10.1109/..
 
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6

Complementary Field-Effect Transistor (CFET) Demonstration ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Liao, S. ; Yang, L. ; Chiu, T.K.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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7

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022
Link: https://doi.org/10.1109/..
 
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8

Critical Process Features Enabling Aggressive Contacted Gat..:

, In: 2022 International Electron Devices Meeting (IEDM),
Chang, Chih-Hao ; Chang, V.S. ; Pan, K.H.... - p. 27.1.1-27.1.4 , 2022
Link: https://doi.org/10.1109/..
 
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9

A 3nm CMOS FinFlex™ Platform Technology with Enhanced Power..:

, In: 2022 International Electron Devices Meeting (IEDM),
Wu, Shien-Yang ; Chang, C.H. ; Chiang, M.C.... - p. 27.5.1-27.5.4 , 2022
Link: https://doi.org/10.1109/..
 
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10

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022
Link: https://doi.org/10.1109/..
 
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11

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,
Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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12

Fast Switching of STT-MRAM to Realize High Speed Applicatio..:

, In: 2020 IEEE Symposium on VLSI Technology,
Lee, T. Y. ; Yamane, K. ; Kwon, J.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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13

Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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14

Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Naik, V. B. ; Lim, J. H. ; Lee, T. Y.... - p. 2.3.1-2.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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15

5nm CMOS Production Technology Platform featuring full-fled..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Yeap, Geoffrey ; Chen, X. ; Yang, B. R.... - p. 36.7.1-36.7.4 , 2019
Link: https://doi.org/10.1109/..
 
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