Jing, Lim
72  Ergebnisse:
Personensuche X
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1

Tailoring of poly(vinyl alcohol) hydrogels properties by in..:

, In: 2011 Defense Science Research Conference and Expo (DSR),
Qin-Yuan Zhang ; Zu-Yong Wang ; Jing Lim... - p. 1-3 , 2011
 
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3

Contributors:

, In: Digital Human Modeling and Medicine,
 
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4

Latent Emission-Augmented Perspective-Taking (LEAPT) for Hu..:

, In: 2023 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS),
Chen, Kaiqi ; Lim, Jing Yu ; Kuan, Kingsley. - p. 8006-8013 , 2023
 
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5

Unifying Web Security Assessments with MALA: A Modular Appr..:

, In: 2023 IEEE International Conference on Service Operations and Logistics, and Informatics (SOLI),
 
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6

Stacked Bidirectional Long Short-Term Memory for Stock Mark..:

, In: 2021 IEEE International Conference on Artificial Intelligence in Engineering and Technology (IICAIET),
 
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7

A Study on Building Inspection and Building Defect Rectific..:

, In: Advances in Civil and Industrial Engineering; Handbook of Research on Inclusive and Innovative Architecture and the Built Environment,
Kam, Kenn Jhun ; Lim, Xiao Jing ; Lim, Tze Shwan. - p. 235-255 , 2023
 
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8

Remote Operation Status Tracking for Manufacturing Machines..:

, In: 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
 
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9

Comparative Analysis of Machine Learning Techniques for Aco..:

, In: 2022 3rd International Conference on Artificial Intelligence and Data Sciences (AiDAS),
 
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10

Non-Intrusive Operation Status Tracking for Legacy Machines..:

, In: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
 
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11

List of contributors:

, In: Integrated and Hybrid Process Technology for Water and Wastewater Treatment,
 
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12

Central Nervous System Involvement in Painful Diabetic Neur..:

, In: Contemporary Diabetes; Diabetic Neuropathy,
Selvarajah, Dinesh ; Lim, Joyce ; Teh, Kevin... - p. 427-438 , 2023
 
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13

An Electrical Inline-Testable Structure to Monitor Gate-Sou..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Zhu, Hai ; Onishi, Katsunori ; Wu, Stephen... - p. 1-4 , 2023
 
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15

A Wafer Scale Hybrid Integration Platform for Co-packaged P..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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