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Kedarnath, Balakrishnan
3  Ergebnisse:
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1

Re-configurable embedded core test protocol:

, In: Proceedings of the 2004 Asia and South Pacific Design Automation Conference,
Wang, Seongmoon ; Chakradhar, Srimat T. ; Kedarnath, Balakrishnan - p. 234-237 , 2004
Link: https://dl.acm.org/doi/1..
 
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2

Test cost reduction for SoC using a combined approach to te..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Zhou, Quming ; Balakrishnan, Kedarnath J. - p. 39-44 , 2007
Link: https://dl.acm.org/doi/1..
 
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3

Reconfigurable Linear Decompressors Using Symbolic Gaussian..:

, In: Proceedings of the conference on Design, Automation and Test in Europe - Volume 2,
Balakrishnan, Kedarnath J. ; Touba, Nur A. - p. 1130-1135 , 2005
Link: https://dl.acm.org/doi/1..
 
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