Kim, Jongseob
2  Ergebnisse:
Personensuche X
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A Pathway to Improve the Reliability of p-GaN Gate HEMTs th..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Hwang, Injun ; Jeon, Woochul ; Hwang, Sun-Kyu... - p. 61-64 , 2022
 
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8/spl times/10 Gb/s terrestrial optical free space transmis..:

, In: Optical Fiber Communication Conference and Exhibit,
Moon-Cheol Jeong ; Jong-Seob Lee ; Sang-Yuep Kim... - p. 405,406,407 , 2002
 
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