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Kim, Yoo-Shin
852  Ergebnisse:
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1

The Inversive Relationship Between Bugs and Patches: An Emp..:

, In: 2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW),
Kim, Jinhan ; Park, Jongchan ; Yoo, Shin - p. 314-323 , 2023
Link: https://doi.org/10.1109/..
 
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2

Fonte: Finding Bug Inducing Commits from Failures:

, In: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE),
An, Gabin ; Hong, Jingun ; Kim, Naryeong. - p. 589-601 , 2023
Link: https://doi.org/10.1109/..
 
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3

Repairing DNN Architecture: Are We There Yet?:

, In: 2023 IEEE Conference on Software Testing, Verification and Validation (ICST),
Kim, Jinhan ; Humbatova, Nargiz ; Jahangirova, Gunel.. - p. 234-245 , 2023
Link: https://doi.org/10.1109/..
 
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4

Repairing Fragile GUI Test Cases Using Word and Layout Embe..:

, In: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST),
Yoon, Juyeon ; Chung, Seungjoon ; Shin, Kihyuck... - p. 291-301 , 2022
Link: https://doi.org/10.1109/..
 
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5

Ahead of Time Mutation Based Fault Localisation using Stati..:

, In: 2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE),
Kim, Jinhan ; An, Gabin ; Feldt, Robert. - p. 253-263 , 2021
Link: https://doi.org/10.1109/..
 
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6

Selecting test inputs for DNNs using differential testing w..:

, In: Proceedings of the 29th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering,
Ma, Yu-Seung ; Yoo, Shin ; Kim, Taeho - p. 1467-1470 , 2021
Link: https://dl.acm.org/doi/1..
 
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7

Reducing DNN labelling cost using surprise adequacy: an ind..:

, In: Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering,
Kim, Jinhan ; Ju, Jeongil ; Feldt, Robert. - p. 1466-1476 , 2020
Link: https://dl.acm.org/doi/1..
 
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8

Evaluating Surprise Adequacy for Question Answering:

, In: Proceedings of the IEEE/ACM 42nd International Conference on Software Engineering Workshops,
Kim, Seah ; Yoo, Shin - p. 197-202 , 2020
Link: https://dl.acm.org/doi/1..
 
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9

Generating test input with deep reinforcement learning:

, In: Proceedings of the 11th International Workshop on Search-Based Software Testing,
Kim, Junhwi ; Kwon, Minhyuk ; Yoo, Shin - p. 51-58 , 2018
Link: https://dl.acm.org/doi/1..
 
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10

Comparing line and AST granularity level for program repair..:

, In: Proceedings of the 4th International Workshop on Genetic Improvement Workshop,
An, Gabin ; Kim, Jinhan ; Yoo, Shin - p. 19-26 , 2018
Link: https://dl.acm.org/doi/1..
 
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11

Learning Without Peeking: Secure Multi-party Computation Ge..:

, In: Search-Based Software Engineering; Lecture Notes in Computer Science,
Kim, Jinhan ; Epitropakis, Michael G. ; Yoo, Shin - p. 246-261 , 2018
Link: https://doi.org/10.1007/..
 
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12

GNN-based Ethereum Smart Contract Multi-Label Vulnerability..:

, In: 2024 International Conference on Information Networking (ICOIN),
Cheong, Yoo-Young ; Choi, La Yeon ; Shin, Jihwan... - p. 57-61 , 2024
Link: https://doi.org/10.1109/..
 
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13

Device Driver Emulator for Parallel Computing Accelerator S..:

, In: 2022 13th International Conference on Information and Communication Technology Convergence (ICTC),
Lim, Eun-Ji ; Ahn, Shin-Young ; Kim, YoungHo. - p. 2352-2355 , 2022
Link: https://doi.org/10.1109/..
 
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14

A low phase noise and low power series coupled quadrature V..:

, In: 2008 IEEE Radio and Wireless Symposium,
Cheol-Hoe Kim ; Soo-Hwan Shin ; Hyung-Joun Yoo - p. None , 2008
Link: https://doi.org/10.1109/..
 
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15

Fabrication of 3D trench PZT capacitors for 256Mbit FRAM de..:

, In: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.,
June-Mo Koo ; Ji-Eun Lim ; Dong-Chul Yoo... - p. 4 pp. , 2005
Link: https://doi.org/10.1109/..
 
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