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Kumar, Navjeet
19  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

IoT Based Smart Charger : An ESP8266 Based Automatic Cha..:

, In: Proceedings of the International Conference on Big Data and Internet of Thing,
Kumar, Navjeet ; Sundaram, K. Meenakshi ; Anusuya - p. 153-157 , 2017
Link: https://dl.acm.org/doi/1..
 
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2

Unveiling the Role of Interface and Dielectric Wall Traps w..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Rathore, Sunil ; Kumar, Sandeep ; Shakir, Mohd... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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3

Sensitivity and Reliability Assessment of a Strained Silico..:

, In: 2024 IEEE Latin American Electron Devices Conference (LAEDC),
Gandhi, Navneet ; Rathore, Sunil ; Jaisawal, Rajeewa Kumar... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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4

List of contributors:

, In: Green Approaches in Medicinal Chemistry for Sustainable Drug Design,
Anjali, Km. ; Banik, Bimal Krishna ; Bhalla, Aman... - p. xiii-xiv , 2024
Link: https://doi.org/10.1016/..
 
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5

Small Signal Analysis of Nanosheet Transistor for sub-THz F..:

, In: 2024 Device Research Conference (DRC),
Patel, Jyoti ; Bagga, Navjeet ; Kumar, Vivek. - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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6

Self-Heating and Interface Traps Assisted Early Aging Revel..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Jaisawal, Rajeewa Kumar ; Rathore, Sunil ; Gandhi, Navneet... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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7

Self-Heating Aware Threshold Voltage Modulation Conforming ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Rathore, Sunil ; Jaisawal, Rajeewa Kumar ; Kondekar, P. N.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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8

Noise Analysis in FinFET-based Analog Circuit with Technolo..:

, In: 2023 IEEE Devices for Integrated Circuit (DevIC),
Patil, Mallikarjun ; Jaisawal, Rajeewa Kumar ; Banchhor, Shashank... - p. 486-489 , 2023
Link: https://doi.org/10.1109/..
 
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9

Gate Oxide Induced Reliability Assessment of Junctionless F..:

, In: 2023 IEEE SENSORS,
Gandhi, Navneet ; Jaisawal, Rajeewa Kumar ; Rathore, Sunil... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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10

Demonstration of a Junctionless Negative Capacitance FinFET..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Gandhi, Navneet ; Jaisawal, Rajeewa Kumar ; Rathore, Sunil... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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11

Modeling and Simulation Analysis of Solar Charging Station ..:

, In: 2023 5th International Conference on Smart Systems and Inventive Technology (ICSSIT),
Kaur, Navjeet ; Bindal, Ranjit Kumar - p. 344-349 , 2023
Link: https://doi.org/10.1109/..
 
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12

Analytical Model of Dual Cavity Nanowire Tunnel FET-based D..:

, In: 2023 IEEE Devices for Integrated Circuit (DevIC),
Sarkhel, Saheli ; Rathore, Sunil ; Saha, Priyanka... - p. 470-475 , 2023
Link: https://doi.org/10.1109/..
 
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13

Device Design Aware and Interface Thermal Resistance Assist..:

, In: 2022 IEEE International Conference on Emerging Electronics (ICEE),
Rathore, Sunil ; Banchhor, Shashank Kumar ; Jaisawal, Rajeewa Kumar... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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14

Impact of Random Spatial Fluctuation in Non-Uniform Crystal..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Chauhan, Nitanshu ; Garg, Chirag ; Ni, Kai... - p. P23-1-P23-6 , 2022
Link: https://doi.org/10.1109/..
 
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15

Role of Interfacial Oxide on Capacitance Matching in a Nega..:

, In: 2022 IEEE International Conference on Emerging Electronics (ICEE),
Jaisawal, Rajeewa Kumar ; Rathore, Sunil ; Kondekar, Pravin N... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
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