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2010 IEEE International Conference on Bioinformatics and Biomedicine Workshops (BIBMW) ,
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PEP-1-Peroxiredoxin protein efficiently protects Raw 264.7 ..:
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2024 International Conference on Electronics, Information, and Communication (ICEIC) ,
2
Highly Linear Charging/Discharging of Charge Trap FET Using..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
3
A 25.78125Gbps Bi-directional Transceiver with Framed-Pulse..:
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2019 IEEE Asian Solid-State Circuits Conference (A-SSCC) ,
4
A 4-GHz Sub-harmonically Injection-Locked Phase-Locked Loop..:
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Proceedings of the 6th International Conference on Ubiquitous Information Management and Communication ,
5
The profiling method in multicore processor for effective p..:
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Proceedings of the 6th International Conference on Ubiquitous Information Management and Communication ,
6
Real user-environment migration between heterogeneous ISA p..:
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Systems Collaboration and Integration; Automation, Collaboration, & E-Services ,
7
Optimization in Pharmacy Automation System:
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ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC) ,
8
An 86.71875GHz RF transceiver for 57.8125Gb/s waveguide lin..:
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2022 IEEE International Solid- State Circuits Conference (ISSCC) ,
9
A 50Gb/s PAM-4 Bi-Directional Plastic Waveguide Link with C..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
10
A 16 GB 1024 GB/s HBM3 DRAM with On-Die Error Control Schem..:
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2022 IEEE International Solid- State Circuits Conference (ISSCC) ,
11
A 1-Tb, 4b/Cell, 176-Stacked-WL 3D-NAND Flash Memory with I..:
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2022 IEEE International Solid-State Circuits Conference (ISSCC) ,
12
A 16Gb 9.5Gb/S/pin LPDDR5X SDRAM With Low-Power Schemes Exp..:
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2022 9th International Conference on Condition Monitoring and Diagnosis (CMD) ,
13
Measurement Conditions of Conduction Current for Diagnosis ..:
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2022 9th International Conference on Condition Monitoring and Diagnosis (CMD) ,
14
Effect of Pre-stressed Thermal Ageing and Electric Field du..:
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Proceedings of the 23rd Conference on Design, Automation and Test in Europe ,
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