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X
Lanza, C.
107  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

X-ray Backscatter Security Inspection with Enhanced Depth o..:

, In: 2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC),
Arodzero, Anatoli ; Alreja, Vijay ; Boucher, Salime... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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2

Security X-ray Screening with Modulated-Energy Pulses:

, In: 2019 IEEE International Symposium on Technologies for Homeland Security (HST),
Arodzero, Anatoli ; Boucher, Salime ; Burstein, Paul... - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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3

Neutron Techniques for Detection of Explosives:

, In: Counterterrorist Detection Techniques of Explosives,
Lanza, Richard C. - p. 131-155 , 2007
Link: https://doi.org/10.1016/..
 
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4

Contributors:

, In: Counterterrorist Detection Techniques of Explosives,
Barat, Robert ; Cagan, Avi A. ; DeLucia Jr., Frank C.... - p. xiii-xiv , 2007
Link: https://doi.org/10.1016/..
 
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5

Endoscopic Transseptal Frontal Sinusotomy:

, In: Rhinologic and Sleep Apnea Surgical Techniques,
Batra, Pete S. ; Lanza, Donald C. - p. 235-241 ,
Link: https://doi.org/10.1007/..
 
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6

Software-Defined Manufacturing for the Entire Life Cycle at..:

, In: Advances in Automotive Production Technology – Towards Software-Defined Manufacturing and Resilient Supply Chains; ARENA2036,
Behrendt, Sebastian ; Martin, Michael ; Puchta, Alexander... - p. 25-34 , 2023
Link: https://doi.org/10.1007/..
 
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7

Improving Production System Flexibility and Changeability T..:

, In: Lecture Notes in Production Engineering; Production at the Leading Edge of Technology,
Behrendt, S. ; Ungen, M. ; Fisel, J.... - p. 705-716 , 2023
Link: https://doi.org/10.1007/..
 
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8

Influence of the magnetic field on dielectric breakdown in ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Maldonado, D. ; Roldan, J. B. ; Roldan, A. M.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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9

List of contributors:

, In: Principles of Tissue Engineering,
Abe, Masashi ; Ahlstrom, Jon D. ; Albon, Julie... - p. xxix-xxxix , 2020
Link: https://doi.org/10.1016/..
 
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10

Reversible dielectric breakdown in h-BN stacks: a statistic..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Roldan, J. B. ; Maldonado, D. ; Jimenez-Molinos, F.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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11

Software documentation : the practitioners' perspective:

, In: Proceedings of the ACM/IEEE 42nd International Conference on Software Engineering,
Aghajani, Emad ; Nagy, Csaba ; Linares-Vásquez, Mario... - p. 590-601 , 2020
Link: https://dl.acm.org/doi/1..
 
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12

Contributors:

, In: Principles of Regenerative Medicine,
Agarwal, Rachit ; Ahlstrom, Jon D. ; Ahmad, Rafiq... - p. xix-xxiv , 2018
Link: https://doi.org/10.1016/..
 
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13

List of Contributors:

, In: Essentials of Stem Cell Biology,
Addis, Russell C. ; Anversa, Piero ; Arcidiacono, Judith... - p. xxiii-xxviii , 2014
Link: https://doi.org/10.1016/..
 
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14

List of Contributors:

, In: Principles of Tissue Engineering,
Bowles, Robby D. ; (Tony) Smith, Anthony J. ; Ahlstrom, Jon D.... - p. xxxiii-xlviii , 2014
Link: https://doi.org/10.1016/..
 
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15

Contributors:

, In: Principles of Regenerative Medicine,
Aboushwareb, Tamer ; Ahlstrom, Jon D. ; Almarza, Alejandro J.... - p. ix-xix , 2011
Link: https://doi.org/10.1016/..
 
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