Lee, Ga Hyun
43  Ergebnisse:
Personensuche X
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1

A Stochastic Frontier Analysis (SFA)-Based Method for Detec..:

, In: IFIP Advances in Information and Communication Technology; Advances in Production Management Systems. Production Management Systems for Responsible Manufacturing, Service, and Logistics Futures,
Lee, Ga Hyun ; Jeon, Hyun Woo - p. 29-42 , 2023
 
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2

Highly Reliable 28nm Embedded Flash Process Development for..:

, In: 2021 IEEE International Memory Workshop (IMW),
 
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3

Test Structures for Noise Reduction of Fully Depleted-Silic..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
 
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4

Investigation of Random Telegraph Noise Characteristics wit..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
 
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5

The Comparison Analysis of the Cervical Features Between Se..:

, In: Lecture Notes in Computer Science; Perinatal, Preterm and Paediatric Image Analysis,
Jeon, Yeong-Eun ; Son, Ga-Hyun ; Kim, Ho-Jung.. - p. 98-108 , 2023
 
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6

A Meta-Learning Approach for Medical Image Registration:

, In: 2022 IEEE 19th International Symposium on Biomedical Imaging (ISBI),
Park, Heejung ; Lee, Gyeong Min ; Kim, Soopil... - p. 1-5 , 2022
 
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7

Unsupervised Learning Model for Registration of Multi-phase..:

, In: Medical Image Computing and Computer Assisted Intervention – MICCAI 2020; Lecture Notes in Computer Science,
Lee, Gyoeng Min ; Seo, Kwang Deok ; Song, Hye Ju... - p. 201-210 , 2020
 
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8

A 1.01V 8.5Gb/s/pin 16Gb LPDDR5x SDRAM with Self-Pre-Emphas..:

, In: 2023 IEEE Asian Solid-State Circuits Conference (A-SSCC),
Ahn, Hyun-A ; Sung, Yoo-Chang ; Kim, Yong-Hun... - p. 1-4 , 2023
 
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9

Reliability of Indium Solder Joints using a Laser-Assisted ..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Jung, Ji Eun ; Eom, Yong-Sung ; Joo, Jiho... - p. 2237-2243 , 2024
 
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10

Epitaxial Strain Control of HfxZr1-xO2 with Sub-nm IGZO See..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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11

Learning Over Dirty Data Without Cleaning:

, In: Proceedings of the 2020 ACM SIGMOD International Conference on Management of Data,
Picado, Jose ; Davis, John ; Termehchy, Arash. - p. 1301-1316 , 2020
 
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12

Channel Selective Relation Network for Efficient Few-shot F..:

, In: 2024 IEEE International Conference on Consumer Electronics (ICCE),
Kim, Chae-Lin ; Lee, Ga-Eun ; Choi, Young-Ju.. - p. 1-3 , 2024
 
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13

Performance Improvement of ZnO Based ReRAM with SiCN Oxygen..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Ko, Woon-San ; Song, Myeong Ho ; Kim, Ki-Nam... - p. 1-3 , 2023
 
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14

Controllable Conductive Filament Formation in Resistive-RAM..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Byun, Jun-Ho ; Ko, Woon-San ; Kim, Ki-Nam... - p. 1-3 , 2023
 
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15

Small Object Detection Technology Using Multi-Modal Data Ba..:

, In: 2023 International Conference on Information Networking (ICOIN),
Park, Chi-Won ; Seo, Yuri ; Sun, Teh-Jen.. - p. 420-422 , 2023
 
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