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X
Lee, H.‐L.
~ 1800  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Development of High Accuracy VI Sensor:

, In: 2023 IEEE International Conference on Plasma Science (ICOPS),
Oh, J. H. ; Lee, J. S. ; Lee, H. H.. - p. 01-01 , 2023
Link: https://doi.org/10.1109/..
 
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2

Unveiling the Impact of High Frequency On-State and Off-Sta..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chang, Y. K. ; Liao, P. J. ; Liu, Y. S.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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3

Study on Liquid-Vapor Two Phase Region of Copper Using Unde..:

, In: 2023 IEEE International Conference on Plasma Science (ICOPS),
Park, S. ; Lee, H. ; Chung, K.-J. - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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4

The First CMOS-Integrated Voltage-Controlled MRAM with 0.7n..:

, In: 2023 International Electron Devices Meeting (IEDM),
Suhail, H. ; He, H. ; Yang, J.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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5

Reliability Improvement with Optimized BEOL Process in Adva..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Lee, J.H. ; Woo, B.W. ; Lee, Y.M.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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6

Calculate waist trajectory during golf swing from IMU sensi..:

, In: IET International Conference on Engineering Technologies and Applications (ICETA 2023),
Yang, C. -H. ; Liu, J. -Q. ; Lee, D. -H. - p. None , 2023
Link: https://doi.org/10.1049/..
 
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7

Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Yoo, J.-H. ; Jo, H.-B. ; Lee, I.-G.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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8

Three-Dimensional Phase-Field based Quantum Transport Simul..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lee, H. ; Shin, M. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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9

Development of Coded Aperture Collimator for Drone - Based ..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Lee, I. ; Park, Y. ; Jeon, K.... - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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10

Ongoing Evolution of DRAM Scaling via Third Dimension -Vert..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Han, J.W. ; Park, S.H. ; Jeong, M.Y.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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11

Deep learning-based automatic detection of defective steel ..:

, In: 27th International Conference on Electricity Distribution (CIRED 2023),
Pak, J. ; Shim, Y. ; Song, J.... - p. None , 2023
Link: https://doi.org/10.1049/..
 
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12

Deep Learning Model Observers Trained with Human Observer D..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Shao, M. ; Byrd, D. W. ; Abbey, C. K.... - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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13

Design and Fabrication of a Low Inductance Multigap Gas Swi..:

, In: 2023 IEEE International Conference on Plasma Science (ICOPS),
Ryu, J. ; Lee, H. ; Chung, K.-J. - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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14

Experimental demonstration of PON slicing with slice aware ..:

, In: 49th European Conference on Optical Communications (ECOC 2023),
Chung, H. S. ; Doo, K.- H. ; Kim, K. O.... - p. None , 2023
Link: https://doi.org/10.1049/..
 
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15

The Effect of Electron Emission and Reflection at Material ..:

, In: 2023 IEEE International Conference on Plasma Science (ICOPS),
Shin, J.H. ; Kim, H. ; Hwang, S.J.. - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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