Personensuche
X
?
Proceedings of the 28th International Cryogenic Engineering Conference and International Cryogenic Materials Conference 2022; Advanced Topics in Science and Technology in China ,
1
A 0.79 W/150 K Micro Pulse Tube Cryocooler:
, In:
?
2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) ,
2
Transient multi-THz spectroscopy of single and multilayer 2..:
, In:
?
2019 IEEE 4th International Conference on Condition Assessment Techniques in Electrical Systems (CATCON) ,
3
A Novel Autonomous Technique for Early Fault Detection on O..:
, In:
?
2008 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society ,
4
In vivo tumor detection on rabbit with biopsy needle as MRE..:
, In:
?
Proceedings of the 2004 ACM SIGGRAPH international conference on Virtual Reality continuum and its applications in industry ,
6
Multi-resolution image data fusion using 2-D discrete wavel..:
, In:
?
2022 International Electron Devices Meeting (IEDM) ,
8
A 3nm CMOS FinFlex™ Platform Technology with Enhanced Power..:
, In:
?
Proceedings of the International Field Exploration and Development Conference 2018; Springer Series in Geomechanics and Geoengineering ,
9
Study on Tensile Test Elongation Variation Law for High-Str..:
, In:
?
IET 2nd International Conference on Wireless, Mobile and Multimedia Networks (ICWMMN 2008) ,
10
Vector Switching Scheme (VSS) for Source Routing Protocol o..:
, In:
?
2007 International Semiconductor Device Research Symposium ,
11
Superior n-MOSFET performance by optimal stress design:
, In:
?
2006 International Interconnect Technology Conference ,
12
Damage-Free Low-k Treatment Verified by a Novel Microwave M..:
, In:
?
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. ,
13
Advanced Dual Metal Gate MOSFETs with High-k Dielectric for..:
, In:
?
2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers. ,
14
Channel Stress Modulation and Pattern Loading Effect Minimi..:
, In:
?
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ,
15