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Liao, P. J.
152  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Enhancing EM Reliability and Lifetime Modeling: A Multi-Lin..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Chang, H. C. ; Liao, P. J. ; Chen, S. H.... - p. 01-04 , 2024
Link: https://doi.org/10.1109/..
 
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2

Unveiling the Impact of High Frequency On-State and Off-Sta..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chang, Y. K. ; Liao, P. J. ; Liu, Y. S.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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3

A New Ramp Stress Reliability Assessment on Pulse Energy Ba..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Chang, P. C. ; Liao, P. J. ; Wu, C. H.... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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4

Multi-view anal fistula disease diagnosis based on local en..:

, In: 7th International Conference on Vision, Image and Signal Processing (ICVISP 2023),
Tan, C. ; Tian, L. ; Chen, H.. - p. None , 2023
Link: https://doi.org/10.1049/..
 
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5

The Field-dependence Endurance Model and Its Mutual Effect ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Chang, Y. K. ; Liao, P. J. ; Yeong, S. H.... - p. 3A.1-1-3A.1-5 , 2022
Link: https://doi.org/10.1109/..
 
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6

Investigation of First Fire Effect on VTH Stability and End..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Chang, P. C. ; Liao, P. J. ; Heh, D. W.... - p. 4A.3-1-4A.3-5 , 2022
Link: https://doi.org/10.1109/..
 
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7

Engineering defects in pristine amorphous chalcogenides for..:

, In: 2022 International Electron Devices Meeting (IEDM),
Ambrosi, E. ; Wu, C. H. ; Lee, H. Y.... - p. 18.7.1-18.7.4 , 2022
Link: https://doi.org/10.1109/..
 
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8

CeO2-Doped Hf0.5Zr0.5O2 Ferroelectrics for High Endurance E..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Yu, Z. ; Saini, B. ; Liao, P. J.... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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9

Investigation of Defect Engineering Toward Prolonged Endura..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lee, J.H. ; Chou, C.H. ; Liao, P.J.... - p. 32.6.1-32.6.4 , 2022
Link: https://doi.org/10.1109/..
 
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10

Low variability high endurance and low voltage arsenic-free..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ambrosi, E. ; Wu, C. H. ; Lee, H. Y.... - p. 28.5.1-28.5.4 , 2021
Link: https://doi.org/10.1109/..
 
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11

A Dissolved Gas Analysis Investigation of Natural Ester und..:

, In: 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP),
Zhang, C. ; Liao, J. P. ; Zhong, L. S.... - p. 196-199 , 2020
Link: https://doi.org/10.1109/..
 
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12

Cold CMOS as a Power-Performance-Reliability Booster for Ad..:

, In: 2020 IEEE Symposium on VLSI Technology,
Chiang, H. L. ; Chen, T. C. ; Wang, J. F.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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13

Experimental Characterization of Low-Latency Multiple and T..:

, In: 2019 Conference on Lasers and Electro-Optics (CLEO),
Almaiman, A. ; Cao, Y. ; Alishahi, F.... - p. 1-2 , 2019
Link: https://doi.org/10.1364/..
 
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14

Contributor contact details:

, In: Handbook of Smart Coatings for Materials Protection,
Makhlouf, Abdel Salam Hamdy ; Zarras, Peter ; Stenger-Smith, J.D.... - p. xv-xviii , 2014
Link: https://doi.org/10.1016/..
 
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15

Incorporating microcapsules in smart coatings for corrosion..:

, In: Handbook of Smart Coatings for Materials Protection,
Zhang, W. ; Liao, L.P. ; Zhao, Y. - p. 287-306 , 2014
Link: https://doi.org/10.1533/..
 
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