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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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Deep Learning Approach to Predict Alzheimer's Disease throu..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
2
A 3.96μm, 124dB Dynamic Range, 6.2mW Stacked Digital Pixel ..:
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2022 International Joint Conference on Neural Networks (IJCNN) ,
3
A TOPSIS based Self-Organizing Double Loop Recurrent Broad ..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
4
The Failure Mechanism of the Guard-Rings in Two Different P..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
5
Ge Single-Crystal-Island (Ge-SCI) Technique and BEOL Ge Fin..:
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2020 International Joint Conference on Neural Networks (IJCNN) ,
6
A Novel Self-Organizing Emotional CMAC Network for Robotic ..:
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2020 IEEE Symposium on VLSI Technology ,
7
Ultrahigh responsivity and tunable photogain BEOL compatibl..:
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Springer Proceedings in Materials; Advanced Materials ,
8
Combining the Kalman Filter and Particle Filter in Object T..:
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Intelligent Robotics and Applications; Lecture Notes in Computer Science ,
9
Towards Deep Learning Based Robot Automatic Choreography Sy..:
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Advances in Intelligent Systems and Computing; Advances in Artificial Intelligence, Software and Systems Engineering ,
10
Cascading Convolutional Neural Network for Steel Surface De..:
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2019 IEEE SmartWorld, Ubiquitous Intelligence & Computing, Advanced & Trusted Computing, Scalable Computing & Communications, Cloud & Big Data Computing, Internet of People and Smart City Innovation (SmartWorld/SCALCOM/UIC/ATC/CBDCom/IOP/SCI) ,
11
Robotic Chinese Calligraphy with Human Preference:
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Advances in Intelligent Systems and Computing; Advances in Computational Intelligence Systems ,
12
A Robotic Chinese Stroke Generation Model Based on Competit..:
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Advances in Physical Ergonomics & Human Factors; Advances in Intelligent Systems and Computing ,
13
Steel Surface Defects Detection Based on Deep Learning:
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2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
14
Reduction of wafer arcing during high aspect ratio etching:
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2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
15
Investigations on elimination of plasma-induced Si substrat..:
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