Ling, C. Y.
437  Ergebnisse:
Personensuche X
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1

Defect in Zinc Oxide Nanostructures Synthesized by a Hydrot..:

, In: Nanoscale Phenomena; Lecture Notes in Nanoscale Science and Technology,
 
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2

Robust Redundancy Allocation by the Min-max Regret Framewor..:

, In: 2022 13th International Conference on Reliability, Maintainability, and Safety (ICRMS),
Ling, C. Y. ; Lei, J. Z. ; He, K. Z. - p. 243-247 , 2022
 
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3

Optimal Multi-type Component Reassignment Design Under Inte..:

, In: 2023 Annual Reliability and Maintainability Symposium (RAMS),
J Z, Lei ; C Y, Ling ; M, Xie. - p. 1-5 , 2023
 
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4

Flow ripple reduction of even-piston pump with valve-contro..:

, In: CSAA/IET International Conference on Aircraft Utility Systems (AUS 2022),
Wang, R. ; Jiao, Z. ; Ling, Y.... - p. None , 2022
 
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5

Access Balancing in Storage Systems by Labeling Partial Ste..:

, In: 2020 IEEE International Symposium on Information Theory (ISIT),
Chee, Y. M. ; Colbourn, C. J. ; Dau, H.... - p. 566-570 , 2020
 
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6

Contributors:

, In: Colour Design,
Abel, A. ; Barbur, J.L. ; Best, J.... - p. xiii-xiv , 2017
 
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7

Contributor contact details:

, In: Colour Design,
Best, J. ; Hanson, A.R. ; Barbur, J.L.... - p. xiii-xvi , 2012
 
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8

Contributors:

, In: Leibel and Phillips Textbook of Radiation Oncology,
 
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9

Contributors:

, In: Oncologic Imaging,
 
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10

Photobioreactors:

, In: Current Developments in Biotechnology and Bioengineering,
Chang, J.-S. ; Show, P.-L. ; Ling, T.-C.... - p. 313-352 , 2017
 
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11

List of Contributors:

, In: Current Developments in Biotechnology and Bioengineering,
Baeza, J.A. ; Barroso, M.F. ; Bayrak, E.S.... - p. xvii-xxi , 2017
 
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12

Contributors:

, In: Microbiome and Metabolome in Diagnosis, Therapy, and other Strategic Applications,
 
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13

A semicustom clock/timer chip:

, In: 1991 IEEE International Symposium on Circuits and Systems (ISCAS),
Ling, E.C.H. ; Soon, Y.C. - p. 1909,1910,1911 , 1991
 
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14

The Role of Functional Diversity, Collective Team Identific..:

, In: Research Anthology on Agile Software, Software Development, and Testing,
Chen, Jin ; Lim, Wei Yang ; Tan, Bernard C.Y.. - p. 1535-1566 , 2022
 
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15

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022
 
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