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X
Liou, Cher-Ming
18  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Root Cause Analysis of Intermittent Digital System Reset an..:

, In: 2024 Annual Reliability and Maintainability Symposium (RAMS),
Tan, Cher Ming ; Wang, Steve ; Huang, Shawn LH... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Pre-Mature Reliability Degradation of 5G Network Electronic..:

, In: 2024 Annual Reliability and Maintainability Symposium (RAMS),
Tan, Cher Ming ; Wang, Steve ; Xiong, Josh MP. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Reliability tests standards for LEDs:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 157-170 , 2023
Link: https://doi.org/10.1016/..
 
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4

Lumen recovery in high-power LEDs under prolonged outdoor o..:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 85-100 , 2023
Link: https://doi.org/10.1016/..
 
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5

Effect of environment on white packaged LED reliability:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 49-72 , 2023
Link: https://doi.org/10.1016/..
 
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6

Concurrent Multiband CMOS Low Noise Amplifier Design for In..:

, In: 2023 IEEE 15th International Conference on ASIC (ASICON),
Phetpadriew, Peerapat ; Thangarasu, Bharatha Kumar ; Mahalingam, Nagarajan... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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7

Comparison of blue and white packaged LED degradation:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 121-143 , 2023
Link: https://doi.org/10.1016/..
 
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8

Permanent degradation mechanisms of high-power packaged whi..:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 101-120 , 2023
Link: https://doi.org/10.1016/..
 
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9

Packaged LEDs degradation under UV radiation effect:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 145-156 , 2023
Link: https://doi.org/10.1016/..
 
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10

General failure analysis techniques for packaged LED:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 19-48 , 2023
Link: https://doi.org/10.1016/..
 
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11

Introduction:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 1-17 , 2023
Link: https://doi.org/10.1016/..
 
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12

Initial rapid lumen degradation for high-power white packag..:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 73-83 , 2023
Link: https://doi.org/10.1016/..
 
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13

Design of GaN based Comparator Circuit for Radiation Detect..:

, In: 2020 IEEE 17th India Council International Conference (INDICON),
Pandey, Vimal Kant ; Ming Tan, Cher ; Sharma, Sandeep - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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14

Quantitative Service Reliability Assessment on Single and M..:

, In: Communications in Computer and Information Science; Information, Communication and Computing Technology,
Pandey, Harshit ; Tan, Cher Ming - p. 82-92 , 2019
Link: https://doi.org/10.1007/..
 
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15

Dependence of operating conditions on lifetime of Phosphor ..:

, In: 2019 IEEE 9th International Nanoelectronics Conferences (INEC),
Singh, Preetpal ; Tan, Cher Ming ; Kuo, Hao-Chung... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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