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1

Interface Trap Density of Commercial 1.7 kV SiC Power MOSFE..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),

Spejo, Lucas B. ; Lucidi, Samuel ; Puydinger Dos Santos, Marcos V... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

2

Vulnerability of the day: concrete demonstrations for softw..:

, In: Proceedings of the 2013 International Conference on Software Engineering,

Meneely, Andrew ; Lucidi, Samuel - p. 1154-1157 , 2013

Link: https://dl.acm.org/doi/1..

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