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Advances in Microbial Food Safety ,
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Food safety standards in the fresh produce supply chain: ad..:
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2008 IEEE International Electron Devices Meeting ,
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High-performance nMOSFET with in-situ phosphorus-doped embe..:
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2007 IEEE Symposium on VLSI Technology ,
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Stress dependence and poly-pitch scaling characteristics of..:
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2006 International Electron Devices Meeting ,
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High Performance 45-nm SOI Technology with Enhanced Strain,..:
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2021 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) ,
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