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30th Annual Proceedings Reliability Physics 1992 ,
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Post-stress interface trap generation: a new hot-carrier in..:
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Extended Abstracts of the 2023 CHI Conference on Human Factors in Computing Systems ,
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InExChange: Fostering Genuine Social Connection through Emb..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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Molybdenum Nitride as a Scalable and Thermally Stable pWFM ..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
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