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Martı́nez-L, A.
6  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Parameter extraction in a 65nm nMOSFET technology from 300 ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Lopez-L, O. ; Martinez-R, I. ; Durini, D.... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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2

A Performance Comparative at Low Temperatures of Two FET Te..:

, In: 2020 17th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE),
Lopez-L, Omar ; Martinez, I. ; Durini, D.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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3

Electrical and Thermal Characterization for SOI p-type FinF..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
Lopez-L., Omar ; Martinez, I ; Gutierrez-D, E.A.... - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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4

Efficient graph management based on bitmap indices:

, In: Proceedings of the 16th International Database Engineering & Applications Sysmposium,
Martínez-Bazan, Norbert ; Águila-Lorente, M. Ángel ; Muntés-Mulero, Victor... - p. 110-119 , 2012
Link: https://dl.acm.org/doi/1..
 
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5

BIBEX : a bibliographic exploration tool based on the DE..:

, In: Proceedings of the 11th international conference on Extending database technology: Advances in database technology,
Gómez-Villamor, Sergio ; Soldevila-Miranda, Gerard ; Giménez-Vañó, Aleix... - p. 735-739 , 2008
Link: https://dl.acm.org/doi/1..
 
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6

Dex : high-performance exploration on large graphs for i..:

, In: Proceedings of the sixteenth ACM conference on Conference on information and knowledge management,
Martínez-Bazan, Norbert ; Muntés-Mulero, Victor ; Gómez-Villamor, Sergio... - p. 573-582 , 2007
Link: https://dl.acm.org/doi/1..
 
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