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Mita, Takeshi
5  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Damage Assessment Structure of Thermal-Annealing Post-Proce..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Okamoto, Yuki ; Makimoto, Natsumi ; Misumi, Kei... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

Drop-in test structure chip to visualize residual stress of..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
Usami, Naoto ; Ota, Etsuko ; Higo, Akio.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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3

Supersensitive Ultrasound Probes for Medical Imaging by Pie..:

, In: 2020 IEEE International Ultrasonics Symposium (IUS),
Suzuki, Kenji ; Nakayama, Yuta ; Shimizu, Naoki... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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4

Monolithic Integration of P(VDF-TrFE) Thin Film on CMOS for..:

, In: 2019 IEEE International Ultrasonics Symposium (IUS),
Suzuki, Kenji ; Nakayama, Yuta ; Kanagawa, Izuru... - p. 807-810 , 2019
Link: https://doi.org/10.1109/..
 
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5

Continuity assessment for supercritical-fluids-deposited (S..:

, In: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS),
Usami, Naoto ; Ota, Etsuko ; Higo, Akio.. - p. 54-57 , 2019
Link: https://doi.org/10.1109/..
 
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