Moon, Hyo-Seok
36  Ergebnisse:
Personensuche X
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1

Highly Scalable Saddle-Fin (S-Fin) Transistor for Sub-50nm ..:

, In: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.,
Park, Sung-Wook ; Hong, Sung-Joo ; Kim, Jin-Woong... - p. 32-33 , 2006
 
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2

A Multi-Stage Deep Learning Approach Incorporating Text-Ima..:

, In: Proceedings of the 2024 International Conference on Multimedia Retrieval,
Seo, Jangwon ; Hwang, Hyo-Seok ; Lee, Jiyoung... - p. 1312-1316 , 2024
 
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3

Mitigating Coordinate Transformation for Solving Partial Di..:

, In: 2022 Thirteenth International Conference on Ubiquitous and Future Networks (ICUFN),
Hwang, Hyo-Seok ; Son, Suhan ; Kim, Yoojoong. - p. 382-385 , 2022
 
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4

Contributors:

, In: Indian Summer Monsoon Variability,
Agarwal, N.K. ; Anila, Sebastian ; Ashok, Karumuri... - p. xiii-xvi , 2021
 
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6

When two worlds collide:

, In: Routledge International Handbook of Religion in Global Society,
Tong, Joy K.C. ; Kang, Samuel ; Lee, Peter. - p. 155-165 , 2020
 
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7

Contributors:

, In: Smart and Connected Wearable Electronics,
 
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8

Reinforcement Learning based Sequential Multi-Robot Task Al..:

, In: 2023 23rd International Conference on Control, Automation and Systems (ICCAS),
Lee, Na-Hyun ; Uhm, Tae-Young ; Park, Ji-Hyun.. - p. 1858-1861 , 2023
 
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10

Terahertz In0.8 Ga0.2 As quantum-well HEMTs toward 6G appli..:

, In: 2022 International Electron Devices Meeting (IEDM),
Park, Wan-Soo ; Jo, Hyeon-Bhin ; Kim, Hyo-Jin... - p. 11.4.1-11.4.4 , 2022
 
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11

A 12-bit 10GS/s 16-Channel Time-Interleaved ADC with a Digi..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Moon, Kyoung-Jun ; Oh, Dong-Ryeol ; Park, Young-Hyo... - p. 172-173 , 2022
 
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12

Towards Provenance-based Trust-aware Model for Socio-Techni..:

, In: 2021 IEEE 45th Annual Computers, Software, and Applications Conference (COMPSAC),
Lee, Hyo-Cheol ; Lee, Seok-Won - p. 761-767 , 2021
 
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13

$\text{In}_{x}\text{Ga}_{1-x}\text{As}$ quantum-well high-e..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Yun, Seung-Won ; Jo, Hyeon-Bhin ; Yoo, Ji-Hoon... - p. 11.3.1-11.3.4 , 2021
 
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14

Improvement of PCB reliability under HAST conditions by enh..:

, In: 2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC),
Lee, Hyung-Do ; Kim, Han-Gyu ; Moon, Jeong-Geun... - p. 53-56 , 2020
 
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15

Effect of Plasma Input Power and Feeding Speed on the Surfa..:

, In: 2020 IEEE International Conference on Plasma Science (ICOPS),
Choi, Min-Gyu ; Chung, Sang-Min ; Yang, In-Mok... - p. 613-613 , 2020
 
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