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X
Nagib, David A.
3  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Overcoming post-silicon validation challenges through quick..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Lin, David ; Hong, Ted ; Li, Yanjing... - p. 320-325 , 2013
Link: https://dl.acm.org/doi/1..
 
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2

Quick detection of difficult bugs for effective post-silico..:

, In: Proceedings of the 49th Annual Design Automation Conference,
Lin, David ; Hong, Ted ; Fallah, Farzan.. - p. 561-566 , 2012
Link: https://dl.acm.org/doi/1..
 
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3

Session details: Design methods for manufacturability enhan..:

, In: Proceedings of the 42nd annual Design Automation Conference,
Hakim, Nagib Z. ; Blaauw, David ; Orshansky, Michael , 2005
Link: https://dl.acm.org/doi/1..
 
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