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1

Drain Current Degradation Induced by Charge Trapping/De-Tra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kim, Taeyoung ; Lim, Suhwan ; Myeong, Ilho... - p. P6.EM-1-P6.EM-4 , 2024
Link: https://doi.org/10.1109/..
 
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2

A Comprehensive Study of Read-After-Write-Delay for Ferroel..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Myeong, Ilho ; Lim, Suhwan ; Kim, Taeyoung... - p. 9B.3-1-9B.3-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Comprehensive Design Guidelines of Gate Stack for QLC and H..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lim, Suhwan ; Kim, Taeyoung ; Myeong, Ilho... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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